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Dektak Surface Profiling Measuring System

Title: Dektak Surface Profiling Measuring System
Company: Capovani Brothers Inc.
Location: Scotia, NY, USA
Email: cbi@capovani.com
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Description:

CINCINNATI SUB-ZERO THERMAL SHOCK CHAMBER -75°C TO 371° C

Manufacturer

Dektak

Model

IIA

Description

Surface Profile Measuring System

Step Height Resolution

5.00 Ã

Stylus Radius

12.50 micron

Controller Type

Microprocessor Controller Type

Accessories

Unitron camera with W.D. 35.5mm lense/1:6.5 Zoom

Other Information

Measurement Display Range: 200 Ã to 655,000 Ã
Vertical Resolution: 5 Ã
Scan Length: 50 microns to 30 mm
Scan Speed Ranges: Low (50 sec/scan), Med (12.5 sec/scan), High (3.12 sec/scan)
Leveling: Manual, 2 point programmable or cursor leveling
Stylus Tracking Force: adjustable from 10 mg to 50 mg (0.1 mN to 0.4 milliNewtons)
Maximum Sample Thickness: 20 mm (0.75")
Sample Stage Diameter: 127 mm (5")
Sample Stage Translation (from center): X axis = +/- 10 mm; Y axis = + 10 mm/- 70 mm
Sample Stage Rotation: continuous 360 deg
Maximum Sample Weight: 0.5 kg (1 lb)
Warm-up Time: 15 minutes for maximum stability

Power Requirements

115 V 50/60 Hz

Year of Manufacture

1984

Condition

Very Good

Weight

68 lb (31 kg)

Close Date: March 31, 2015
Phone: Capovani Brothers Inc. / +1 (518) 346-8347
Email: cbi@capovani.com
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