| Title: |
Dektak Surface Profiling Measuring System |
| Company: |
Capovani Brothers Inc. |
| Location: |
Scotia, NY, USA |
| Email: |
cbi@capovani.com |
|
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|
| Description: |
|  |
Manufacturer | Dektak |
Model | IIA |
Description | Surface Profile Measuring System |
Step Height Resolution | 5.00 Ã |
Stylus Radius | 12.50 micron |
Controller Type | Microprocessor Controller Type |
Accessories | Unitron camera with W.D. 35.5mm lense/1:6.5 Zoom |
Other Information | Measurement Display Range: 200 Ã to 655,000 Ã
Vertical Resolution: 5 Ã
Scan
Length: 50 microns to 30 mm
Scan Speed Ranges: Low (50 sec/scan), Med (12.5 sec/scan), High (3.12
sec/scan)
Leveling: Manual, 2 point programmable or cursor leveling
Stylus Tracking Force:
adjustable from 10 mg to 50 mg (0.1 mN to 0.4 milliNewtons)
Maximum Sample Thickness: 20 mm
(0.75")
Sample Stage Diameter: 127 mm (5")
Sample Stage Translation (from center): X axis =
+/- 10 mm; Y axis = + 10 mm/- 70 mm
Sample Stage Rotation: continuous 360 deg
Maximum Sample
Weight: 0.5 kg (1 lb)
Warm-up Time: 15 minutes for maximum stability
|
Power Requirements | 115 V 50/60 Hz |
Year of Manufacture | 1984 |
Condition | Very Good |
Weight | 68 lb (31 kg)
|
|
| Close Date: |
March 31, 2015 |
| Phone: |
Capovani Brothers Inc. / +1 (518) 346-8347 |
| Email: |
cbi@capovani.com |