| Title: |
NANOMETRICS NANOSPEC 210 Thin Film Measurement System |
| Company: |
Capovani Brothers Inc. |
| Location: |
Scotia, NY, USA |
| Email: |
cbi@capovani.com |
|
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|
| Description: |
| |
 |
Manufacturer |
Nanometrics |
|
Model |
NANOSPEC 210 |
Description |
Thin Film Measurement System |
|
Wafer Size Range |
|
|
Minimum |
125 mm |
|
Maximum |
150 mm |
Scanning Stage |
YES |
|
Other Information |
Eyepiece: 10X
Objectives: M5X-0.1, M10X-0.25, M40X-0.65
Stage: 5" and 6" wafers |
Power Requirements |
220 V 15.0 A
50/60 Hz 1 Phase |
|
Weight |
86 lb (39 kg) |
|
| Close Date: |
November 30, 2015 |
| Phone: |
Capovani Brothers Inc. / +1 (518) 346-8347 |
| Email: |
cbi@capovani.com |