NANOMETRICS NANOSPEC 210 Thin Film Measurement System

Title: NANOMETRICS NANOSPEC 210 Thin Film Measurement System
Company: Capovani Brothers Inc.
Location: Scotia, NY, USA
Email: cbi@capovani.com
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Description:
  NANOMETRICS NANOSPEC 210

Manufacturer

Nanometrics

Model

NANOSPEC 210

Description

Thin Film Measurement System

Wafer Size Range

  Minimum

125 mm

  Maximum

150 mm

Scanning Stage

YES

Other Information

Eyepiece: 10X
Objectives: M5X-0.1, M10X-0.25, M40X-0.65
Stage: 5" and 6" wafers

Power Requirements

220 V     15.0 A     50/60 Hz     1 Phase

Weight

86  lb  (39 kg)

Close Date: November 30, 2015
Phone: Capovani Brothers Inc. / +1 (518) 346-8347
Email: cbi@capovani.com
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