Horiba Scientific - World's Most Sensitive Spectrofluorometer for Nanomaterials

Malverm Morphjologi G3 particle characterization system

NEW: Netzsch STA 449 F1 Jupiter® – Simultaneous TG-DSC

The Nanonic Hydra(TM) - The Next Evolution in BioAFM

NanoTest™, the complete nanomechanical testing center

Founding Editor - Professor Nico de Rooij

Head of Laboratory in the Institute of Microtechnology, University of Neuchâ-tel, Switzerland (IMT UNI-NE).

Member of the editorial boards for the journals Sensors and Actuators, Sensors and Materials and the IEEE Journal of Microelectromechanical Systems.

His research activities include micro-fabricated sensors, actuators, and microsystems.

Nico.deRooij@unine.ch

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Highly Anti-microbial self-sanitizing nanotech solutions

Beckman Coulter - Particle Characterization Equipment

True, deep-trench imaging capability for Atomic Force Microscopy, with CNT AFM probes from C|D|I

Hiden Analytical Ltd. - Quadrupole mass spectrometer, Langmuir probe, Residual gas analyser, RGA

Nanotech 2010 - World's largest nanotech conference and expo

Surface Metrology, Thin Films from LOT Oriel

Cost Effective Metrology Solutions from LOT Oriel and Ambios Technology

AZoNano is grateful for the support provided by our sponsors to both AZoNano.com and to the authors
and peer reviewers of AZoJono -Journal of Nantechnology Online - open access to leading Nanotech Science.