Advanced Life Science Research with the BioScope II Atomic Force Microscope from Veeco
The BioScope II atomic force microscope (AFM) has been engineered specifically to facilitate advanced life science research: from imaging, probing and manipulating biological systems such as a living cell down to single molecules.
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Advanced Nanoscale Characterization of Polymer Materials Using Phase Imaging with the Innova from Veeco
The Innova SPM from Veeco is an ideal instrument for high resolution imaging of delicate samples. In addition, the Innova combines this outstanding core performance with generous data acquisition bandwidth and facile signal access, thus enabling a wide range of demanding research applications.
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AFM Probe with High-Q Factor for UHV Applications from Nanosensors - New Product
Nanosensors have announced the Q30K-Plus, a novel scanning proximity probe with an outstanding Q-factor and enhanced signal to noise ratio for UHV applications. Posted October 28 2005
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Ambios Q-View - Combining Micro-Interferometry with Scanning Probe Microscopy (SPM) - LOT Oriel
Q-View is a micro-interferometer module that has been seamlessly integrated into the Q-Scope SPM. This combination provides two synergistic technologies on a single platform.
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Analyzing Nanoscale Inclusions Within a Polymer Matrix Using Nano Thermal Analysis and the nano-TA Thermal Probe from Anasys Instruments
Nano-TA is a local thermal analysis technique which combines the high spatial resolution imaging capabilities of atomic force microscopy with the ability to obtain an understanding of the thermal behaviour of materials with a spatial resolution of sub-100nm.
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Analyzing Structure of Multilayer Polyelectrolyte Deposition using SARFUS from Nanolane
In the present study, we show that SARFUS is a well-adapted and rapid technique to analyse the structure of each layer and in the same time to measure their thicknesses.
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Anasys Thermal Analysis Product Wins Prestigious R&D100 Award - News Item
Anasys Instruments announced that its nano-TA™ sub-100nm local thermal analysis product is a recipient of the prestigious R&D100 award for 2007. Nanoscale thermal analysis (nano-TA) enables the study of thermal properties locally at sub-100nm resolution. Posted July 3 2007
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Atomic Force Microscope (AFM) Cantilevers - LOT Oriel
LOT Oriel provides standard cantilevers for contact and non-contact modus, cantilever for MFM, EFM, Force Modulation mode as well as High Aspect Ratio cantilevers. These cantilevers are suitable for all commercial AFM systems.
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Atomic Force Microscope Variable Field Module from Asylum Research For Magnetic Field Applications
For researchers that want to apply a magnetic field to their samples, Asylum Research has developed a small sample Variable Field Module (VFM™) for the MFP-3D™ System. This module is useful for MFM, conductance, and other applications where the sample has a dependence on the applied magnetic field.
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Atomic Force Microscopy ( AFM ) And Transmission Electron Microscopy (TEM)
Atomic Force Micrsocopy (AFM) and Transmission Electron Microscopy are two tools used in the characterisation of nanosized structures. The two techniques are explained and their modes of operation briefly described.
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