Rudolph Technologies provides process characterization solutions and applications
support for semiconductor manufacturers around the world. The company's product
portfolio for wafer processing customers includes high-performance metrology
systems for opaque and transparent film measurement, sophisticated yield management
software on a fabwide scale and automated macro defect inspection systems that
can identify and analyze defects on all surfaces of a silicon wafer.
Products and technologies developed primarily for final manufacture and test
include software products for defect analysis and review, high-speed macro defect
inspection systems and probe card test and analysis solutions. With a strong
history beginning in 1940, our strategy for continued technological and market
leadership includes aggressive research and development, and dedicated applications
support on a global scale.