Hybrid Nitride AFM Probe for Contact Mode from Nanoworld - New Product

AZoNano - The A to Z of Nanotechnology - Hybrid Nitride AFM Probe for Contact Mode from Nanoworld

NanoWorld today officially introduced its new Hybrid-Nitride AFM probe for contact-mode.

The Hybrid-Nitride™ probe combines silicon nitride cantilevers and tips with unique features like single holder chips for easy handling, single holder design to avoid breaking residue, rounded shoulder design to prevent mechanical contact between chip and sample and a notch design of the holder chip for clear indication of the cantilever type.

Posted August 1st, 2004

Date Added: Aug 25, 2004 | Updated: Jun 11, 2013
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