Transmission Electron Microscopy High Resolution At Atomic Levels For Material And Nanotechnology Research Using the Tecnai G² Polara from FEI Company

Background

Fundamental research within materials science and nanotechnology requires investigations down to the atomic level. The Tecnai G² series of transmission electron microscopes provides high-resolution 2D and 3D imaging and analysis through a high level of microscope automation and intelligence. Built on more than 50 years of experience in electron microscopy, Tecnai G² microscopes combine modern day technology with the stringent demands of an innovative scientific community.

Key Benefits

  • Dedicated cryo instrument down to liquid helium temperatures
  • Automated double-tilt cryo tomography at high tilt angles
  • Concurrent transfer of up to six samples at cryo temperature in vacuum
  • Optimized stage stability at low temperature
  • High-contrast TWIN lens
  • Rapid acceleration voltage switching

Tecnai G² Sphera Features

The easy-to-use Tecnai G² series is designed to ensure high-quality images and facilitate the work of the microscope user. The Tecnai G² series has a high level of automation without limiting full user control. The Tecnai G² Polara is ready for new applications like EFTEM (for analytical capabilities), or Remote Operation or an Automatic Aperture System (for further automation).

Upgrades and Future Requirements

In the world of research, developments occur at a high pace. The Tecnai design philosophy ensures applications flexibility for today and tomorrow, making it easy to add new applications and upgrade functionality. FEI Company collaborates closely with the scientific community to better understand its needs and to co-develop dedicated tools to help understand and explain the complex relationship of materials structure and analysis.

Tecnai G² microscopes help build a detailed understanding of a world of decreasing dimensions: today and in the future.

Source: FEI Company
For more information on this source please visit FEI Company

Date Added: Apr 14, 2005 | Updated: Jun 11, 2013
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