Scanning Electron Microscope To Accommodate The Widest Range of Samples For Any SEM System; The Quanta FEG – Supplier Data By FEI Company


The Quanta FEG SEM is a versatile high resolution, low vacuum scanning electron microscope with three modes (high vacuum, low vacuum and ESEM) to accommodate the widest range of samples of any SEM system.

Key Benefits

•        Seamless "point and click" transition between imaging modes

•        Superior low vacuum, low kV imaging

•        Simultaneous secondary electron (SE) and back-scattered electron (BSE) imaging in low vacuum mode

•        Ultra-stable for analytical applications (EDX, EBSD, WDX)

•        Easy-to-use, four quadrant/single quadrant user interface

•        Optional STEM imaging

Features and Use

The Quanta is easy to use. Its four quadrant image display simultaneously provides surface information and phase distribution through the live imaging of secondary electron (SE) and back-scattered electron (BSE) images. A single mouse click switches imaging modes.

The low vacuum detectors are not sensitive to light generated during heating of samples, so in-situ dynamic heating experiments can be imaged and recorded live at temperatures up to 1500° C. The Quanta FEG is a versatile system, which can be equipped with analytical systems such as EDS, WDS and EBSD, and a STEM detector for bright-field and dark-field imaging of samples.


The Quanta FEG is available with three different stage sizes: 6'' (150 mm), 4'' (100 mm) or 2'' (50 mm).

Source: FEI Company

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