In the watch and jewellery industry new types of noble metal alloys are desired for new colours. This means, new polishing methods and compositions are needed.
Polishing Method Quality
Profilometer measurements become meaningless on samples with a high quality surface finish. The AFM helps to quantify the quality of the polishing method and the easyScan from NanoSurf can be used to characterise such samples.
Figure 1. Polished stainless steel with defect. 20x20µm image, z-range: 100nm
The image shows a mechanically polished stainless steel surface measured with AFM. The surface roughness is below 5 nm. A polishing defect is visible. Here a diamond grain from the polishing paste becomes embedded in the metal.
The AFM measurement was done in "Dynamic Force" operating mode.