MultiMode Closed-Loop Scanner
The MultiMode Closed-Loop Scanner adds accuracy and convenience to the legendary performance and versatility of the MultiMode.
- Measurement accuracy and large scan range
- Easily zoom in to exact regions of interest
- Accurate “point-and-shoot” force curve and force-volume measurements
- Precision nanolithography with optional NanoMan software
MultiMode Closed-Loop Scanner
The MultiMode Closed-Loop Scanner brings the accuracy and precision of closed-loop control to the MultiMode. You no longer need to choose between a SPM offering ultra-high resolution imaging and one offering the accuracy and convenience of closed-loop. The modular design of the MultiMode makes it easy to switch between a closed-loop scanner for routine use and an open-loop scanner for ultra-high resolution work. In addition, you will enjoy the same ease of use, reliability, and support that has made MultiMode the performance leader in SPM technology.
Closed-loop control offers a number of benefits for both imaging applications and force measurement applications, as well as enabling precise nanolithography and nano-manipulation. Not only is imaging more accurate, but it is also more convenient because you can zoom and scan exactly where you desire. For force measurements, having closedloop control makes it easy to target specific areas or structures using our “point and shoot” feature or to perform force-volume or nano-indentation arrays over well-defined areas. And of course nanolithography and nano-manipulation really demand the accuracy offered by closed-loop in order to achieve high-quality results.
The MultiMode Closed-Loop Scanner enhances the MultiMode’s excellent reputation for performance, productivity, reliability, and ease of use.
Figure 1. Left: TappingMode image of Celgard membrane, 1.5μm scan Right: TappingMode image of rat tail collagen, 2.5μm scan
Figure 2. Left: TappingMode height image of floppy disk, 100μm scan Right: MFM phase image of the same area taken in LiftMode
Figure 3. Left: TappingMode height image of EFM test sample, 11μm scan Right: EFM phase image of the same area taken in LiftMode. The center electrode was held at a different voltage bias than the two outer electrodes.
- Supported Configuration MultiMode with NanoScope V controller.
- Scan Range XY: 100 μm, Z: 15 μm
- Sensor Noise XY: <2 nm RMS, Z: <0.4 nm RMS
- Linearity Error XY: <0.05%, Z: <0.05%
- TappingMode Noise Test <1 Å RMS with vibration isolation
- Supported Modes Contact, TappingMode, Phase, LFM,
- Torsional Resonance, MFM, Force
- Spectroscopy, Force Volume, Force
- Modulation, EFM1, Surface Potential1.
- Nanomanipulation and Nanolithography
- supported with optional software. Note:
- Fluid imaging not recommended.
- Applications Modules SCM1, TUNA1, SSRM1, CAFM1
1. Sample bias must be connected externally through NanoScope V front panel. Note: Performance specifcations are typical and subject to change without notice.
This information has been sourced, reviewed and adapted from materials provided by Bruker AXS.
For more information on this source please visit Bruker AXS.