MultiMode Series from Bruker, The World’s Highest-Resolution Scanning Probe Microscopes

Topic List

Background
NanoScope® V, High-Performance Efficiency
Variety of Available Scanners
Broad Range of Operating Modes and Environments
The World's Highest Resolution
Superior Scanning
Nanoscope V - World's Best Controller
New Easy-AFM for Maximum Productivity
Unsurpassed Flexibility and Functionality
Environmental Control Options
Unlimited Application Expandability
Specifications
Performance
Hardware and Software Options

Background

The MultiMode® series represents the world’s highest-resolution, most application-proven scanning probe microscopes.

This high-performance state-of-the-art SPM features a compact hardware design, high-speed fifth-generation controller, environmental control capabilities, and user-friendly software in order to enable remarkably easy acquisition of data from micro- to atomic-scale images. Proven productivity, flexibility, and reliability have made MultiMode series SPMs the performance leader in materials, life sciences, and polymers research.

Figure 1. MultiMode SPM

NanoScope® V, High-Performance Efficiency

  • Measures tip-sample/cantilever dynamics (50MHz data capture)
  • Reduces time looking for small features (5120 x 5120 pixel density)
  • Acquires and displays up to 8 images simultaneously

Variety of Available Scanners

  • Offers flexibility of scan sizes
  • Delivers application-specific accuracy

Broad Range of Operating Modes and Environments

  • Provides flexibility of applications
  • Compact, Rigid Design
  • Produces low-noise, highest resolution images

The World's Highest Resolution

Every facet of the MultiMode system’s electronic and mechanical design has been optimized for the highest resolution, including a short mechanical path, rigid low-vibration construction, and ultra-low-noise electronics. The high resolution of the MultiMode series has helped lead to more scientific publications than all other SPMs combined. The addition of the new, highly advanced NanoScope V controller now means MultiMode V users can be even more productive.

Superior Scanning

The MultiMode SPMs feature multiple scanners that permit each user to tailor the system for individual research. Scanners with large scan ranges up to 125 microns on the XY axes and a Z range up to 5 microns, as well as high-resolution scanners with 0.4 microns on the XY axes and submicron Z range, are available.

The vertical-engage scanners let users position the tip at any point on the surface without adjusting for lateral movement of the tip during approach.

Incorporating a host of proprietary design features, these scanners minimize X,Y, and Z cross-coupling and the effects of nonlinearity and hysteresis, while maintaining calibration throughout the full vertical range. This delivers a level of imaging performance unmatched by any other AFM. Scanner calibration and linearization are maintained by software control, providing the user with easy, direct access to all aspects of scanner operation.

Nanoscope V - World's Best Controller

The new MultiMode SPM system includes the NanoScope V controller, which utilizes advanced high-speed electronics along with A/D and D/A converters operating at 50MHz, to deliver reliable, high-speed data capture. This allows researchers to measure tip-sample/cantilever dynamics in order to study the influence of mechanical properties on the physics of probe-sample interactions and examine timescales previously inaccessible to SPM users.

With high-pixel-density images up to 5120 x 5120, there’s no need to go back and repeat a scan. The high pixel density saves users time when searching for low-density features distributed over large areas, reduces the need to capture several images at lower pixel densities, and eliminates the requirement for offset adjustments to correlate information from multiple images. It also allows observation of large structures and small features in the same image.

The NanoScope V captures everything by displaying (and acquiring for analysis) up to eight images in real-time with unprecedented signal-to-noise ratio.

Thus, users can collect information about multiple properties of a sample concurrently. For instance, this system can do MFM and tapping while capturing height, phase, and amplitude in the tapping line, as well as frequency and amplitude in the lift line.

In addition, a high-speed FPGA delivers feedback in 2μs with independent gain and frequency on digital Q control. The 8X increase in speed facilitates high-speed, high-bandwidth experimentation, such as small cantilever, active cantilever, and resonant control. Multiple independent synchronous lock-in amplifiers permit tapping and torsion, harmonics in EFM, and higher-order vertical and lateral movement.

New Easy-AFM for Maximum Productivity

For the ultimate in streamlined operational simplicity, Easy-AFM™ offers an intuitive, easy-to-follow graphic user interface for new or infrequent SPM users. It reduces the set up time by automatically adjusting the scanning parameters, and obtaining high-quality TappingMode™ in air images on most samples at a push of a button. Easy-AFM is ideal for multi-user environments.

Unsurpassed Flexibility and Functionality

NanoScript™ open-architecture option provides an extensive list of functions to control the SPM for custom experiments and nanoscale research. These functions can also be called from any programming language that can act as a client of Microsoft’s Component Object Model (COM), including LabVIEW™, MATLAB™, and Visual Basic.

Environmental Control Options

The MultiMode heater/cooler line provides increased thermal-control convenience to life sciences and polymers research. A single controller regulates sample temperatures from -35 to 250°C. Several models are offered, allowing researchers to purchase a thermal solution tailored to their needs. For use with air and inert gases, three temperature ranges are available: -35 to 100°C environments, ambient to 250°C, and -35 to 250°C. Another model operates in fluids or air from ambient to 60°C using standard MultiMode scanners.

Other features include an improved liquid-cooled scanner that operates with two different heating/cooling elements and provides temperature sensing to protect the scanner from damage by extensive heat.

Unlimited Application Expandability

The MultiMode performs a full range of SPM techniques for surface characterization of properties like topography, elasticity, friction, adhesion, and electrical and magnetic fields:

  • TappingMode AFM
  • Contact Mode AFM
  • PhaseImaging™
  • Lateral Force Microscopy (LFM)
  • Magnetic Force Microscopy (MFM)
  • Force Modulation
  • Electric Force Microscopy (EFM)
  • Scanning Capacitance Microscopy (SCM)
  • Surface Potential Microscopy
  • Force-Distance and Force-Volume Measurements
  • Electrochemical Microscopy (ECAFM)
  • PicoForce Force Spectroscopy
  • Tunneling AFM (TUNA)
  • Conductive AFM (CAFM)
  • Scanning Spreading Resistance Microscopy (SSRM)
  • Torsional Resonance Mode (TRmode)

Specifications

Performance

  • Microscope MultiMode SPM head; choice of scanners
  • Noise <0.3ÅRMS in vertical (Z) dimension with vibration isolation
  • Sample Size 15mm diameter; 5mm thick
  • Tip/Cantilever Holders TappingMode/contact mode in air (std); TappingMode/force modulation in fluid (optional); Force modulation in air (optional); electrical field (optional); STM converter (optional); Low-current STM converter (optional); contact mode fluid cell (optional); Electrochemistry AFM or STM fluid cell (optional); Electrochemistry tapping mode fluid cell (optional); TRmode (optional)
  • Vibration and Acoustic Isolation Silicone vibration pad provided and acoustic cover (std); Vibration isolation tripod (optional); vibration isolation table (optional); Integrated vibration isolation table and acoustic enclosure (optional)

Hardware and Software Options

  • Optical Viewing System - Provides vertical view of tip and sample surface with optical microscope, color CCD camera, and color monitor
  • Signal Access Module™ - Provides access to every input and output signal between controller and microscope
  • Heater and Cooler - Provides sample heating and cooling for biological applications, polymers and other materials
  • Environmental Chamber - Allows purging of environment at atmospheric pressure when scanning with gases
  • Electrochemistry Package - Required for electrochemical STM/AFM
  • Nonmagnetic Option - Consists of magnet removal from microscope scanner for MFM measurements of low-coercivity samples and applied fields
  • Application Modules - SCM, TUNA, SSRM and CAFM

This information has been sourced, reviewed and adapted from materials provided by Bruker Nano Surfaces.

For more information on this source please visit Bruker Nano Surfaces.

Date Added: Apr 30, 2008 | Updated: Jan 23, 2014
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