MultiMode from Bruker, The Industry Leading Force Measurement System

 

Topic List

Background
New High Performance NanoScope V Controller
The Leader for Performance, Precision and Resolution
The World’s Most-Proven SPM Platform
Innovative Operational Features
NanoScope V – World’s Best Controller Technology
Easy-AFM for Maximum Productivity
Unsurpassed Flexibility and Functionality
New Software Optimized for Force Studies
Key Applications
Single-Molecule Pulling
Intermolecular Interactions
Colloidal Science
Polymer Science

Background

The MultiMode® 8 scanning probe microscope system brings unprecedented accuracy and performance to molecular biology and nanoscale materials research. With its innovative force-measurement features, proven SPM technology, and new high-speed fifth-generation controller, the MultiMode is ideally suited for a broad variety of studies, from protein unfolding and antigen-antibody binding to membrane elasticity and Van der Waals forces.

Figure 1. MultiMode scanning probe microscope system

High Performance NanoScope V Controller

  • Measures tip-sample/cantilever dynamics (50MHz data capture)
  • Reduces time spent looking for features (5120 x 5120 pixel density)
  • Displays and acquires eight images simultaneously
  • Closed-loop Z axis with capacitive sensor
  • Delivers accurate, low-noise measurement of extension in force curves
  • PicoAngler™ tactile sensation
  • Permits intuitive interpretation of molecular force interactions

The Leader for Performance, Precision and Resolution

The MultiMode system offers the best of both worlds: precise force measurements and high-resolution scanning. The patented Multimode scanner incorporates a closed-loop Z axis with a vertical range of 20 microns and an X-Y scan size of greater than 40 microns. While competing “sensored” scanners merely measure the common problems of piezo creep, hysteresis and nonlinearity, the Multimode scanner completely eliminates them, permitting unprecedented accuracy and precision in nanoscale research. This enables force measurements that are simply not possible with open-loop Z axis scanners.

When used in conjunction with our full line of MultiMode open-loop scanners, however, the Multimode system is still able to offer the highest-resolution scanning available. MultiMode SPMs have always held the distinction of delivering the best resolution in the industry due to a host of resolutionenhancing design features. With the MultiMode, you can easily switch between the PicoForce scanner and standard MultiMode scanners to best match the system’s capabilities to your experiment’s demands.

The World’s Most-Proven SPM Platform

The high resolution and high productivity of the MultiMode have led to more scientific publications than all competitive SPMs combined. The MultiMode platform offers the entire range of SPM techniques for measuring surface characteristics and provides unlimited extendibility through a wide selection of imaging modes.

Innovative Operational Features

The new, handheld PicoAngler allows the user to manually explore tip-sample interactions with unprecedented ease. This innovative tool is particularly useful for single-molecule force spectroscopy, providing highly sensitive approach and retraction of the cantilever tip.

Via its force-feedback feature, the PicoAngler enables the user to "feel" the force of interaction (e.g., of a molecule stretching and then suddenly unfolding). Four different levels of sensitivity for manual control of the Z axis and force-feedback allow exploration of interactions over a wide range of distances and forces.

In addition, the MultiMode system includes a low-noise state-of-theart SPM head that dramatically reduces the periodic noise that sometimes appears in force curves on standard SPM systems. This is a crucial benefit since periodic noise can interfere with force spectroscopy measurements in the pico-Newton range.

Unlike competitors’ systems, the MultiMode utilizes a fully automatic, proprietary tip approach that prevents tip-damaging collisions between the probe and the sample surface.

NanoScope V – World’s Best Controller Technology

The fifth-generation NanoScope V controller lets MultiMode users get out of the RMS world and live in the now. By providing reliable 50MHz data capture, the new controller allows measurement of tipsample/cantilever dynamics at timescales previously inaccessible to SPM users. This is enabling a wide range of new advanced single molecule pulling experiments, including acceleration.

It also allows simple measurement of the cantilever spring constant at resonance frequencies up to 2 MHz. High-pixel-density images, up to 5120 x 5120, can eliminate the need to go back and re-scan your sample at progressively higher resolution. The NanoScope V permits users to obtain high-resolution images of large structures and save time when searching for low-density features distributed over large areas. The minimization of repeated scanning preserves sample integrity.

Up to eight images can be simultaneously displayed in real-time (and acquired for analysis) with unprecedented signal-to-noise ratio, so researchers don’t miss out on any potentially important data, regardless of imaging mode. This system can do MFM and tapping while capturing height, phase, and amplitude in the tapping line, as well as frequency and amplitude in the lift line. Also, the system can produce images of height, deflection, TUNA, and two channels of friction, as well as all tapping and all torsion data channels simultaneously.

The NanoScope V controller’s highspeed FPGA is at the heart of the controller. The imaging feedback loop runs with a 2ìs clock cycle, a factor of eight improvement over previous controllers. This allows for faster feedback, less error, and reduces the possibility of tip and sample damage.

Three independent lock-in amplifiers enable researchers to monitor the amplitude and phase of multiple cantilever resonances from either the vertical or lateral deflection signals. For example users can collect information about tapping and torsion, harmonics in EFM, and characterization of material properties at higher harmonics.

Other features, including Q control and configurable data filtering are also implemented digitally on the FPGA, maximizing performance and flexibility.

Easy-AFM for Maximum Productivity

For the ultimate in streamlined operational simplicity, Easy-AFM™ offers an intuitive, easy-to-follow graphic user interface for new or infrequent SPM users. It reduces the time for initial setup (including probe, laser, and detector alignments) by engaging the sample with the probe (in air), automatically adjusting the scanning parameters, and obtaining high-quality TappingMode™ images on most samples at a push of a button.

Easy-AFM is ideal for multi-user environments.

Unsurpassed Flexibility and Functionality

NanoScript™ open-architecture option provides a growing list of functions to control the SPM for custom experiments and nanoscale research (e.g., nanomanipulation in X,Y, and Z; automated scanning; nanolithography with different tip-sample interactions).

These functions can also be called from any programming language that can act as a client of Microsoft’s Component Object Model (COM), including LabVIEW™, MATLAB®, and Visual Basic.

New Software Optimized for Force Studies

The MultiMode system comes complete with version 7 NanoScope software, which contains application routines designed specifically for force spectroscopy. Based on more than 15 years of SPM experience, the NanoScope V platform offers extensive functionality while delivering customized analysis for specific force studies, such as singlemolecule pulling data. Other software features include, user-defined “scripting” for flexible design of experiments, and powerful off-line processing and exporting tools.

Key Applications

Single-Molecule Pulling

  • DNA stretching
  • Protein folding/unfolding (i.e., Titin, GFP)

Intermolecular Interactions

  • Antibody/antigen interactions
  • Cell adhesion
  • Cell receptor recognition
  • Membrane elasticity

Colloidal Science

  • Colloidal surface interactions
  • Friction forces

Polymer Science

  • Nanoindentation
  • Elasticity

This information has been sourced, reviewed and adapted from materials provided by Bruker Nano Surfaces.

For more information on this source please visit Bruker Nano Surfaces.

Date Added: May 1, 2008 | Updated: Jan 23, 2014
Ask A Question

Do you have a question you'd like to ask regarding this article?

Leave your feedback
Submit