Natural Test Materials and Calibration Gratings for Scanning Probe Microscope (SPM) from NT-MDT

Topics Covered

Background
Natural Test Samples and Calibration Gratings from NT-MDT
NT-MDT Calibration Gratings
     TGQ1 Calibration Grating
     TGZ Calibration Gratings
     TGT Calibration Grating
     TGX1 Square Calibration Grating
     TGG1 Triangular Calibration Grating
     TDGO1 Diffraction Calibration Grating
NT-MDT Natural Test Samples
     Highly Oriented Pyrolitic Graphite (HOPG)
     DNA Test Sample
     Silicon Test Echeloned Pattern (STEPP)

Background

NT-MDT Co. was established in 1991 with the purpose to apply all accumulated experience and knowledge in the field of nanotechnology to supply researchers with the instruments suitable to solve any possible task laying in nanometer scale dimensions. The company NT-MDT was founded in Zelenograd - the center of Russian Microelectronics. The products development are based on the combination of the MEMS technology, power of modern software, use of high-end microelectronic components and precision mechanical parts. As a commercial enterprise NT-MDT Co. exists from 1993.

Natural Test Samples and Calibration Gratings from NT-MDT

Scanning probe microscopy has something in common with the sphere of music. No musical instruments can be played without preliminary adjustment through tuning fork that is the "all-known" gold standard of a sound in the field of music.

Scanning probe microscopy doesn't yield to any musical instruments in respect to complicity, and for accurate and correct operations, scanning probe microscopy should be adjusted at least once every six months. In the world of scanning probe microscopy, the gold standard of adjustment is the calibration grating.

Everyone who is involved with nanotechnology knows the price of mistake when their SPM is uncalibrated or improperly calibrated. With the help of NT-MDT test samples and calibration gratings, it's possible to verify accuracy and to find errors in SPM calculations. The calibration gratings are made of silicon, thus it is possible to achieve accuracy in instrument readings due to absolute predictability of silicon natural structure.

NT-MDT and its' products including accessories are certified by ISO 9001:2008. Moreover all NT-MDT calibration gratings are included in Russian public register as measurement instrumentations. NT-MDT calibration gratings also has Europe (PTB) certifications and can be supplied with calibration certificate of international standard as well.

Enjoy correct measurements with NT-MDT calibration gratings.

NT-MDT Calibration Gratings

TGQ1 Calibration Grating

TGQ1 calibration grating from NT-MDT is intended for:

  • simultaneous calibration in X, Y, Z directions
  • lateral calibration of SPM scanners
  • detection of lateral non-linearity, hysteresis, creep and crosscoupling effects

TGZ Calibration Gratings

TGZ calibration grating series are intended for Z-axis calibration of scanning probe microscopes and nonlinearity measurements and is available with three different step heights.

TGT Calibration Grating

The unique TGT calibration grating from NT-MDT is intended for:

  • tip characterization
  • 3-D visualization of the scanning tip
  • determination of tip sharpness parameters (aspect ratio and curvature radius)
  • tip degradation and contamination control

TGX1 Square Calibration Grating

TGX1 square calibration grating with negative angles from NT-MDT is intended for:

  • lateral calibration of SPM scanners
  • detection of lateral non-linearity, hysteresis, creep, and cross-coupling effects
  • determination of the tip aspect ratio

TGG1 Triangular Calibration Grating

TGG1 triangular calibration grating from NT-MDT is intended for:

  • calibration SPM in X or Y axis
  • detection of lateral and vertical nonlinearity
  • detection of angular distraction
  • tip characterization

TDGO1 Diffraction Calibration Grating

NT-MDT TDGO1 diffraction grating is intended for submicron calibration of scanning probe microscopes in X or Y direction.

NT-MDT Natural Test Samples

Highly Oriented Pyrolitic Graphite (HOPG)

Highly Oriented Pyrolitic Graphite (HOPG) for SPM applications is intended for obtaining:

  • critical Z resolution
  • atomic resolution
  • atomic smooth substrate for customer's objects
  • conductive samples for STM

DNA Test Sample

DNA Test Sample from NT-MDT is intended for:

  • getting started with AFM operation
  • example of how to prepare your own DNA samples
  • estimation of probe tip curvature
  • humidity test
  • Z-resolution test

Silicon Test Echeloned Pattern (STEPP)

Silicon Test Echeloned Pattern (STEPP) for AFM is designed on the base of silicon (111) surface with verified distribution of monatomic steps as main calibrating units for the complex control of AFM set up:

  • height calibration in angstrom and single nanometer intervals on the monatomic steps
  • using as a substrate for investigations of bio and other objects
  • precision imaging of nanoobjects.

Source:NT-MDT Co.

For more information on this source please visit NT-MDT Co.

Date Added: Dec 29, 2009 | Updated: Jun 11, 2013
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