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Topics Covered
About Bruker Nano
NANOS SPM System
High-Resolution Image
Reliable Results
All NANOS Measuring Modes are Available
Applications
NANOS Specifications
Bruker Nano provides Atomic Force Microscope/Scanning Probe Microscope (AFM/SPM) products that stand out from other commercially available systems for their robust design and ease-of-use, whilst maintaining the highest resolution. The NANOS measuring head, which is part of all our instruments, employs a unique fiber-optic interferometer for measuring the cantilever deflection, which makes the setup so compact that it is no larger than a standard research microscope objective.
The firm basis for the quality of our microscopes is a team of experienced scientist and engineers with a background of more than 15 years in the AFM business.
Do you use optical methods for surface analysis and often wish for a higher magnification - 50,000 times or even higher than 500,000 times? Or do you want to perform quantitative structural measurements?
The NANOS measuring head is a complete atomic force microscope that approximates a normal optical objective in size and shape. Enter the fascinating world of the nanosphere with your microscope in the blink of an eye. The NANOS fits into the nosepiece of your microscope just like an optical objective. It can be adapted to fit all common types of microscopes (Zeiss, Leica, Nikon, Olympus).
Simply choose an interesting area of the sample with the optical microscopy method you already use, and then swivel in the NANOS for a direct examination with the SPM. Within minutes, you will obtain a high-resolution image which can be further evaluated with our image processing software, the powerful data analysis software available with the SCANControl C electronics.
The NANOS AFM uses an interferometric detector and high accuracy position detectors: results are accurate, calibrated, and quantitative.
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Liquid immersion version of the NANOS AFM/SPM scanning head. The NANOS LQD can be dipped into a liquid and allows convenient measurement in a Petri dish or similar. The left NANOS has a scan range of 20 µm x 20 µm, the right NANOS has a scan range of 40 µm x 40 µm.
The NANOS offers maximum versatility. All SPM measuring modes can be used, and the system can be easily adapted to new applications. The following standard measuring modes are available: contact, non-contact mode, intermittent contact mode, phase contrast, field contrast for magnetic or electrical characterizations (MFM/EFM), force modulation (FM), lateral force (LFM), Scanning Surface Potential (SSPM), Spreading Resistance (SR), fluid compatibility, metrologycompatible measuring head with sensor. Other modes are available on request.
The NANOS can be used to inspect all biological or inorganic surfaces.
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2D image of a human hair, measured in non-contact mode
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Line profile of the sample in the above image
The specifications of NANOS is given in the table.
| Parameters |
Specifications |
| Scan range |
20 µm x 20 µm x 3 µm
40 µm x 40 µm x 4 µm
80 µm x 80 µm x 6 µm
hardware linearized scan motion in X-Y-direction (optionally in Z-direction) |
| Noise level (Z) |
< 0.05 nm RMS for 20 µm NANOS head, may be substantially higher depending on optical microscope |
| Lateral accuracy |
typically within 0.5%, closed loop scanning |
| Scan speed |
typ. 1 to 10 Hz |
| Detection principle |
fiber optic interferometry, noise level < 0.01 nm RMS |
| Tips |
silicon tips, various types |
| Tip change |
adjustment free |
| Digital input res. |
16 bit A/D |
| Digital output res. |
16 bit D/A |
| Output voltage |
± 165 V, with 2 µV RMS |
| Input channels |
max. 8 simultaneously |
| External inputs |
max. 3 with 16 bit resolution |
| Image size |
freely selectable, from 128 to 4098 pixels |
| Computer interf. |
USB |
| OS |
MS-Windows XP®
MS-Windows Vista® |
Source Bruker AXS - AFM and SPM
For more information on this source please visit Bruker AXS - AFM and SPM