Silicon Probes - Types and Applications of Silicon Probes from Applied Nanostructures

Topics Covered

About Applied NanoStructures
Introduction
ACCESS™ Silicon Probes
ACL Series
ACT Series
FCL™ Series
FORT Series
SHOCON Series
SICON Series
HART0 Series
HART3 Series
HART12 Series

About Applied NanoStructures

Applied NanoStructures, Inc. develops, manufactures, and supplies AFM/SPM Probes for all applications and all major manufacturers. Applied NanoStructures also supply various nanostructures including MEMS and specialized SPM probes for most applications.

Our mission is to provide the highest quality AFM Probes & SPM probes for standard, advanced and customized applications at a faster speed and more affordable price than our competitors.

In addition to providing you with our standard catalogue of products, Applied NanoStructures enjoys working with customers to develop new probes or devices for advanced applications.

Introduction

Applied NanoStructures silicon probes are manufactured out of prime grade, low resistivity n-type Antimony doped, single crystal silicon. Our well-established silicon technology combined with our novel micro-fabrication processes are the key ingredients for achieving high quality monolithic probes with unprecedented tip sharpness. We have many standard silicon probe series designed for a wide variety of applications.

ACCESS™ Silicon Probes

AppNano ACCESS™ probes are sharp silicon probes that allow a direct optical view of the AFM tip and designed for applications that require seeing the tip as it engages the surface.

Base Specifications:

Length (µm): 140
Spring Constant (N/m): 50
Frequency (kHz): 300

ACL Series

Our ACL probes are fabricated from highly doped, monolithic silicon, and are designed for tapping / non-contact mode applications. These probes feature a long, thin cantilever that allows for greater laser clearance than our standard ACT model.

Base Specifications:

Length (µm): 225
Spring Constant (N/m): 45
Frequency (kHz): 190

ACT Series

Our ACT probes are fabricated from highly doped, monolithic silicon, and are designed for tapping / non-contact mode applications. These probes feature a short cantilever.

Base Specifications:

Length (µm): 125
Spring Constant (N/m): 40
Frequency (kHz): 300

FCL™ Series

Applied NanoStructures' FCL™ Series consists of tipless force calibration probes with five cantilevers. These probes are designed for the spring constant calibration of SPM probes.

Base Specifications:

Length (µm): 52-442
Spring Constant (N/m): 0.12-77
Frequency (kHz): 14-1000

FORT Series

Our FORT probes are fabricated from highly doped, monolithic silicon, and are designed for force modulation mode applications. These probes have a medium frequency and spring constant that make them ideally suited for Force Modulation Microscopy.

Base Specifications:

Length (µm): 225
Spring Constant (N/m): 3.0
Frequency (kHz): 62

SHOCON Series

Applied NanoStructures' SHOCON probes are fabricated from highly doped, monolithic silicon, and feature shorter cantilevers than our SICON Series. SHOCON probes are ideal for contact mode applications.

Base Specifications:

Length (µm): 225
Spring Constant (N/m): 0.10
Frequency (kHz): 28

SICON Series

Applied NanoStructures' SICON probes are fabricated from highly doped, monolithic silicon, and feature longer cantilevers than the SHOCON Series. SICON probes are designed for contact mode applications.

Base Specifications: