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Topics Covered
About Applied NanoStructures
Introduction
Tip Specifications
Cantilever Specifications
Available Models
Applied NanoStructures, Inc. develops, manufactures, and supplies AFM/SPM Probes for all applications and all major manufacturers. Applied NanoStructures also supply various nanostructures including MEMS and specialized SPM probes for most applications.
Our mission is to provide the highest quality AFM Probes & SPM probes for standard, advanced and customized applications at a faster speed and more affordable price than our competitors.
In addition to providing you with our standard catalogue of products, Applied NanoStructures enjoys working with customers to develop new probes or devices for advanced applications.
AppNano Doped Diamond Probes offers a unique combination of hardness and conducting tip. The tip side of these probes is coated with polycrystalline diamond. The diamond film is in-situ doped with boron to make it highly conducting. The reflex side of the cantilever is coated with Aluminum. These probes are nanofabricated using highly doped single crystal silicon with unparalleled reproducibility and robustness.
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The tip specificatios are as follows:
- Material: Silicon
- Shape: Triangular Pyramid
- Height (µm): 14-16
- ROC (nm): 100 - 300
- Resistivity (MW.cm):25
The cantilever specifications are as follows:
- Material: Silicon
- Shape: Rectangular
- Front Coating: 100nm Doped Diamond
- Reflex Coating: Aluminum
- Alignment Grooves: YES
The models available are as follows:
- DD-ACTA: Standard Non-Contact/Tapping Mode probe coated with Doped Diamond
- DD-FORTA: Standard Force Modulation probe coated with Doped Diamond
- DD-SICONA: Standard Contact Mode Probe coated with Doped Diamond
Source: Applied NanoStructures
For more information on this source please visit Applied NanoStructures.