Kelvin Probe Force Microscopy - Overview and Instruments Available for Kelvin Probe Force Microscopy from Nanosurf

Topics Covered

Background
Kelvin Probe Force Microscopy
The Nanosurf Nanite
The Nanosurf easyScan 2 AFM
The Nanosurf FlexAFM

Background

Nanosurf is a leading provider of easy-to-use atomic force microscopes (AFM) and scanning tunneling microscopes (STM). Our products and services are trusted by professionals worldwide to help them measure, analyze, and present 3D surface information. Our microscopes excel through their compact and elegant design, their easy handling, and their absolute reliability.

Kelvin Probe Force Microscopy

Kelvin Probe Force Microscopy (KPFM) is an extension of AFM. The technique was first published in 1991 by Nonnenmacher and coworkers. Using KPFM, images can be recorded that contain information on the local work function or local contact potential difference between tip and sample.

Although all Nanite systems with an SPM S200 controller and all current easyScan 2 AFM systems are in principle capable of performing KPFM, the FlexAFM has demonstrated best KPFM performance and is therefore the instrument of choice for this type of measurement.

KPFM measurement. KPFM signal (left) and Topography (right) of local charges that were placed on an insulating (oxide) surface layer in a “Swiss cross” pattern. Image courtesy: Marcin Kisiel, Thilo Glatzel and students of the Nanocurriculum of the University of Basel.

The Nanosurf Nanite

Consider your problems solved. With the Nanosurf Nanite, you can nano-measure hundreds of samples in one day without having to be present during measurements, and without first having to attend specialist nano-training. The Nanite's automation capabilities and efficiency will make nano-surface analysis the industry standard.

The Nanosurf Nanite’s initial draw is its increased efficiency. It allows multiple, batch-programmable measurements to be performed without SPM knowledge, thereby significantly reducing labor cost and training time, and allowing routine measurements to be delegated to technicians.

Standardizing measurements and automatically generating reports will by themselves improve your company's QC, but the added value of high-resolution 3D AFM data over optical analyses will allow you to explore new ways in surface inspection, and will bring your QC to a whole new level.

The Nanosurf easyScan 2 AFM

Atomic force microscopy was invented in 1986 to overcome the limitations of scanning tunnelling microscopy, namely that of conductive samples. This openened up a whole new range of applications to nanoscientists, with almost any type of surface becoming accessible at the nanoscale. But what good is such freedom when it requires specialists to operate the equipment, and advanced skills to teach practical Nano to students?

Enter the easyScan 2 AFM! With the Nanosurf easyScan 2 AFM, operating the equipment and teaching your students is a snap. At the same time, the easyScan 2 AFM is a powerfull surface analysis tool that can be fully tweaked to suit your needs, even in demanding research tasks.

The Nanosurf FlexAFM

Nanosurf’s renowned “ease of use” has been implemented consistently in the FlexAFM scan head. The result is the most flexible and versatile AFM ever. Whether you want to operate the FlexAFM in air or in liquid environments, in Materials or Life Science, in standard imaging or in advanced measuring modes; it makes no difference to you as a user. Handling the FlexAFM is always a piece of cake!

Source: Nanosurf

For more information on this source please visit Nanosurf

Date Added: Mar 4, 2011 | Updated: Jun 11, 2013
Ask A Question

Do you have a question you'd like to ask regarding this article?

Leave your feedback
Submit