Analysis of ePTFE membrane using the easyScan 2 AFM from Nanosurf

Topics Covered

Background
Introduction
Analyzing ePTFE Membrane using the Nanosurf easyScan 2 AFM

Background

Nanosurf is a leading provider of easy-to-use atomic force microscopes (AFM) and scanning tunneling microscopes (STM). Our products and services are trusted by professionals worldwide to help them measure, analyze, and present 3D surface information. Our microscopes excel through their compact and elegant design, their easy handling, and their absolute reliability.

Introduction

The abbreviation ePTFE stands for expanded polytetrafluorethylene, also known as expanded Teflon. The mechanical and medical properties of the material depend strongly on how the Teflon was expanded (mono- or bi-axially) and on the resulting ePTFE network structures. Due to its inert properties inside a human body, ePTFE is often used as an implant material. The empty spaces inside the network structure encourage the growth of soft tissue into such implants, which helps hold the implant in place quickly. There are many different ways to expand PTFE, all leading to different network structures. It is therefore very important to verify that the desired ePTFE structure was obtained after the expansion process.

Analyzing ePTFE Membrane using the Nanosurf easyScan 2 AFM

In this application note, we analyzed an ePTFE membrane using the Nanosurf easyScan 2 AFM. The topography image below clearly shows the intricate network structure of the sample. The length of the fibers and the size-distribution of the knots can conveniently be analyzed using the measurement tools integrated in the Nanosurf control software.

Compared to the conventional method used for this analysis — scanning electron microscopy imaging, where a gold film must first be evaporated onto the ePTFE sample in vacuum to make it conductive — AFM is much faster and easier to perform. With the AFM, ePTFE can be measured directly, without any prior treatment of the sample.

By choosing a grayscale color palette, AFM images can look very similar to the SEM images that engineers in this field are used to. In contrast to SEM, however, the AFM topography images contain quantitative depth information due to the very nature of the recorded data.

ePTFE sample courtesy of Shanghai Suokang medical implants Co. Ltd.

Source: Nanosurf

For more information on this source please visit Nanosurf

Date Added: Mar 4, 2011 | Updated: Jun 11, 2013
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