Quality Control and Development of Advanced Textiles Using Atomic Force Microscopy

By AZoNano.com Staff Writers

Table of Content

Introduction
Nanoporous Textiles
Characterization of Nanometer-Scale Structures
P-100 AFM from Ardic
Conclusion
About Ardic Instruments

Introduction

A range of applications such as healthcare, defense and consumer goods are using advanced textiles. Latest manufacturing techniques allow fabrics to get functionalized with added properties such as bacterial resistance, sweat resistance, and water resistance. High performance textiles extend beyond apparel with industrial applications ranging from automobile to building construction.

Nanoporous Textiles

The functional property of textiles can be altered by controlling porosity. 3D or 2D porous structures can be made with a range of materials that result in changes in the air and water permeability of the fabric. Applications can extend to scaffolds for tissue growth and membranes for biological or chemical processes by altering the material porosity and surface area to mass ratio.

Characterization of Nanometer-Scale Structures

It is possible to provide high-resolution two-dimensional images of the textile surface however the vacuum state and sample preparation process is cumbersome and alters the material properties. Ardic Instruments made use of its AFM while working with an advanced textiles manufacturer to characterize a novel Teflon (PTFE) fabric with 3D nanoporous structures.

It is essential for the researchers of the manufacturer to understand the surface morphology as they tune their production process and optimize the material’s functional properties.

Figure 1. 50µm x 50µm 2D and 3D AFM topography scan of PTFE fibers

Figure 2. 20µm x 20µm 2D and 3D AFM topography scan of PTFE fibers

P100 AFM

The P100 AFM from Ardic Instruments has a sub-nanometer Z spatial resolution, which allows for high-resolution imaging and measurement. The combined open-loop and low-noise scanner enables rapid and effective experiments up to 15µm by 15µm. The innovative astigmatic optical design generates a small 0.56µm laser spot size that enables users to experiment with more compact and faster AFM cantilevers.

In addition, the P100 AFM includes PSX control software, which is highly intuitive and enables users to complete experiments with the least amount of training. The setup and scan process is automated by the one-click scan feature, thereby enabling users to acquire high quality scan results quickly. The integrated scan library management feature facilitates the flagging of scan data and enables users to export or delete scans with ease.

Conclusion

Advancements in the textile industry has a direct impact to one’s quality of life. As more nanometer-scale structures are incorporated, the use of AFMs become prevalent in the development and quality control process.

Systems such as the Ardic Instruments P100 AFM, designed to be cost-effective and simple, are suitable for textiles manufacturers, since many have little or no experience using advanced microscopy equipment.

The P100 AFM is equipped with a perpetually aligned optical system and a One-Click Scan software feature, hence requires minimal training and experience.

About Ardic Instruments

Ardic Instruments is an analytical equipment manufacturer aiming to serve the global scientific community with the best customer experience possible. Through a transparent, accessible, and community-driven approach, Ardic Instruments fosters a direct channel of communication between the end-user and the manufacturer.

Ardic Instruments produces atomic force microscopes, MEMS analyzers, and label-free molecular diagnostic platforms for both academic and industrial applications.

This information has been sourced, reviewed and adapted from materials provided by Ardic Instruments.

For more information on this source, please visit Ardic Instruments.

Date Added: Nov 5, 2013 | Updated: Nov 6, 2013
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