Imaging Ferroelectric Domains with Piezo-Response Mode Imaging

By AZoNano Staff Writers

Table of Content

Introduction
Ferroelectric Domains in PZT Films
Conclusion
About NanoScan AG

Introduction

Generally, in piezo-response mode, images are obtained in contact mode, while applying an extra oscillatory bias potential to the tip. However, in piezoelectric materials this potential triggers a displacement of the sample surface. The structure of the sample domain can be reconstructed by examining the phase and amplitude of the cantilever oscillations with regard to the applied bias.

Ferroelectric Domains in PZT Films

The piezo-response mode can be used for imaging ferroelectric domains. The NanoScan PPMS®-AFM is designed to enable concurrent acquisition of piezo-response and atomic force microscopy (AFM) images.

Figure 1. Contact atomic force microscopy (AFM) imaging.

Figure 2. Piezo-response mode image taken concurrently; the ferroelectric domains in this image are not linked to the topograhical domains in the above image.

Figures 1 and 2 illustrate the piezo-response analysis of a polycrystalline PZT thin film measuring 140nm. Figure 1 indicates the topography and was obtained in contact mode (AFM).

This image displays large grains that measure about 2µm. Figure 2 shows the distribution of the ferroelectric domains, which range between 100 and 1000nm. In the image contrast, the three different grey levels correlate to three separate domain parts.

Conclusion

The piezo-response mode can be utilized for imaging ferroelectric domains. The NanoScan PPMS®-AFM enables concurrent acquisition of piezo-response and atomic force microscopy (AFM) images.

About NanoScan AG

With excellent know-how in the fast growing field of nanoscience, the main focus of NanoScan Ltd is on research and development of high-resolution and versatile magnetic and non-contact scanning force microscopes. These instruments are especially designed to fulfill the present and future analytical needs on nanometer-sized surface structures.

This information has been sourced, reviewed and adapted from materials provided by NanoScan AG.

For more information on this source, please visit NanoScan AG.

Date Added: Dec 18, 2013 | Updated: Jan 3, 2014
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