Nanofiber Characterization with Atomic Force Microscopy

By AZoNano.com Staff Writers

Topics Covered

Introduction to Nanofibers
Atomic Force Microscopy (AFM)
P100 AFM
AFM Analysis of Nanofibers
About Ardic Instruments

Introduction to Nanofibers

Electrospinning techniques are commonly used for nanofiber production. Nanofibers are used in a myriad of applications in industries including pharmaceuticals, chemicals, aerospace and biomedical

Nanoscale glass fibers are crucial in making biocompatible nanocomposites used in orthopedic applications, including regenerative medicine and tissue engineering.

Atomic Force Microscopy (AFM)

AFM is an ideal instrument to perform nanofiber characterization, yielding in-depth topological information in the sub-nanometer scale. One such instrument is the P100 AFM (Figure 1) from Ardic Instruments.

Figure 1. The P100 AFM

P100 AFM

The P100 AFM has a sub-nanometer Z spatial resolution, which allows for high-resolution imaging and measurement. The combined open-loop and low-noise scanner range of up to 15µm by 15µm enables rapid and effective experiments.

The innovative astigmatic optical design requires no alignment of the laser and detector and generates a small 0.56µm laser spot size that enables users to perform analyses with more compact and faster AFM cantilevers.

In addition, the P100 AFM includes PSX control software, which is highly intuitive and enables users to complete experiments with the least amount of training. The setup and scan process is automated by the one-click scan feature, thereby enabling users to acquire high quality scan results quickly.

The integrated scan library management feature facilitates the flagging of scan data and enables users to export or delete scans with ease. Simple probe loading is another key feature of the P100 AFM.

AFM Analysis of Nanofibers

In this article, some examples of nanofiber characterization with AFM are presented. Figure 2 depicts a 20µm x 20µm AFM topography scan of glass fibers. Figure 3 illustrates 20µm x 20µm AFM 3D topography of glass fibers.

Figure 2. 20µm x 20µm AFM topography scan of glass fibers

Figure 3. 20µm x 20µm AFM 3D topography of glass fibers

Figure 4 represents the cross-sectional analysis involving the measurement of the width of nanofibers.

Figure 4. Cross-sectional analysis for the measurement of fiber width

About Ardic Instruments

Ardic Instruments is an analytical equipment manufacturer aiming to serve the global scientific community with the best customer experience possible. Through a transparent, accessible, and community-driven approach, Ardic Instruments fosters a direct channel of communication between the end-user and the manufacturer.

Ardic Instruments produces atomic force microscopes, MEMS analyzers, and label-free molecular diagnostic platforms for both academic and industrial applications.

This information has been sourced, reviewed and adapted from materials provided by Ardic Instruments.

For more information on this source, please visit Ardic Instruments.

Date Added: May 20, 2014 | Updated: May 22, 2014
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