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A Preview of The Commercial Graphene Show 2015

A Preview of The Commercial Graphene Show 2015

AZoNano will be reporting from the Commercial Graphene Show 2015 in Manchester, UK on Thursday 16th and Friday 17th April. This article gives a preview of the key trends and talks to look out for over the two days of the show. [More]
Manufacturing High Vacuum and Ultra-High Vacuum Components – An Interview with Mario Peli

Manufacturing High Vacuum and Ultra-High Vacuum Components – An Interview with Mario Peli

In this interview, Mario Peli talks to AZoNano about Allectra's new manufacturing facility in the UK, as well as the industry in general and some of the projects Allectra is working on. [More]
The Next Generation of In Situ Electron Microscopy Capabilities: An Interview with Michael Zapata III

The Next Generation of In Situ Electron Microscopy Capabilities: An Interview with Michael Zapata III

In this interview, Michael Zapata III, Executive Chairman at Protochips Inc, talks to AZoNano.com about the next generation of in situ electron microscopy. [More]
The Operating Principle and Key Applications of Mass Spectrometry

The Operating Principle and Key Applications of Mass Spectrometry

Mass spectrometry is revolutionising the scientific understanding of matter allowing for breakthroughs in the fields of astronomy, biology, material science and medicine. [More]
Nanopowder Synthesis by Induction Plasma Technology

Nanopowder Synthesis by Induction Plasma Technology

Over the past few years, there has been a growing interest in nanostructured coatings and nanometric powders and such products are being used in industrial applications. [More]
Characterizing Thin Films with Reflectometry Measurements Using the STOE STADI MP

Characterizing Thin Films with Reflectometry Measurements Using the STOE STADI MP

The interference and reflection characteristics of thin films are affected by their properties. Using the STOE thin film attachment, x-ray radiation reflected from a thin film can be used to analyze its thickness. [More]
New Synchrotron Laminograhy Technique to Examine Large Surface Objects

New Synchrotron Laminograhy Technique to Examine Large Surface Objects

Computed tomography(CT) is a well-established technique with synchrotron radiation sources for obtaining bulk information from a number of sample types at micrometer resolution, but a new technique was needed to calculate 3D images of very wide, flat objects. [More]
Investigating Nanoparticle Sintering Using Indirect Nanoplasmonic Sensing (INPS)

Investigating Nanoparticle Sintering Using Indirect Nanoplasmonic Sensing (INPS)

Catalyst deactivation is mainly caused by catalyst sintering, and causes billions of dollars of extra expenditure on catalyst regeneration. Gaining insights into the sintering kinetics and mechanisms is essential in the design of more sintering-resistant catalysts. [More]
Using Indirect Nanoplasmonic Sensing (INPS) in the Optical Nanocalorimetry of Catalytic Reactions

Using Indirect Nanoplasmonic Sensing (INPS) in the Optical Nanocalorimetry of Catalytic Reactions

The heat dissipated from an exothermic catalytic reaction plays key role in catalytic ignition and light-off in catalytic converters. One example is automobile emission cleaning. [More]
The History and Working Principle of the Scanning Electron Microscope (SEM)

The History and Working Principle of the Scanning Electron Microscope (SEM)

Scanning electron microscopy (SEM) uses a finely focused beam of electrons in order to produce a high resolution image of a sample. SEM images have a three dimensional appearance, which is very useful when examining the surface structure of a sample. [More]