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FEI Phenom Scanning Electron and Optical Microscope

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How do you stay at the forefront of your field and remain competitive in a world where critical dimensions are now in the nanometer range?

FEI is the company that helps you see beyond the limits of conventional optical and electron microscopes. Phenom is the easiest-to-use SEM ever made, breaking through the performance barriers of optical microscopes while defining a new standard for usability by non-experts. Now engineers, researchers, educators, and students - with very little training - can make high-resolution, sub-micron images themselves; where they want, how they want, and most importantly, when they want.

World's first Personal Electron Microscope

Phenom is a high resolution desktop imaging tool that simplifies and accelerates your imaging workflow. Never before could you have this level of resolution, magnification and speed at such a price point. With magnifications of 20x to 24,000x and an ultimate resolution of 30 nm, it's ideal for routine inspection and detailed imaging of materials. And, Phenom is extremely easy to operate too, meaning everyone can use it.

  • Phenom is a high resolution desktop imaging tool with an optical camera for never-lost navigation and a high quality electron microscope for detailed imaging.
  • Its innovative user interface and intuitive touch screen control produce superb quality images with minimal operator training.
  • It can handle a wide range of samples with minimal preparation. Samples are loaded instantly with Phenom's patented vacuum technology.
  • Images are saved on a USB memory stick or network storage location for off-line analysis, measurements and distribution.

The FEI Phenom offers value in three ways

  • Efficiency: time savings, cost savings, and far less training required compared to conventional SEMs
  • Effectiveness: desktop imaging and measurement capabilities for applications well beyond the reach of optical microscopes
  • Quality: superior results derived from much higher resolution and depth of focus compared to an optical microscope.

Key specifications

  • Magnification range 20 - 24,000x (Digital zoom 12x)
  • Maximum image resolution 2048x2048 pixels
  • Sample loading time < 30 Seconds
  • Total weight 55kg
  • Motorized sample control

FEI Phenom Scanning Electron and Optical Microscope

 


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