Posted in | AFM Tips, Probes, Cantilevers

Met Een Laag Bedekt Uiteinde AFM - Hoge Aspectverhouding Met verlengde levensduur van Team Nanotec

De Uiteinden zijn met een laag bedekt met geleidend, slijtvast metaalcarbide.
Vlotte en goed bepaalde uiteindeoppervlakte.

Specificaties:

Straal na het met een laag bedekken:
Volledige kegelhoek:

~ 50 NM
< 10="">

Beschikbare cantilevers:
l = 125 µm, C = 40 N/m, FO = kHz 300
l = 225 µm, C = 3.0 N/m, FO = kHz 75

Last Update: 3. February 2012 16:20

Tell Us What You Think

Do you have a review, update or anything you would like to add to this equipment listing?

Leave your feedback

(Logout)

Public Comment Private Feedback to AZoNano.com

Submit

Other Equipment

Aerosol Coating Equipment
Optical Tweezers
AFM Tips, Probes, Cantilevers
Particle Size Analyzers
Atom Probes
Photoluminescence Mapper
Atomic Emission Spectrometers
Piezo Actuators
Atomic Force Microscopes (AFM)
Plasma Cleaning Systems
Atomic Layer Deposition (ALD) Systems
Plasma Etching Systems
Biomedical Atomic Force Microscopes (bio-AFM)
Profilometers
Calorimeters
Raman Spectrometers
Carrier Concentration Profiler
Sample Preparation Equipment
Control Systems
Scanning Electron Microscope (SEM) Accessories
Cryogenic Probe Stations
Scanning Electron Microscopes (SEM)
Data Loggers
Scanning Near-Field Optical Microscopes (SNOM)
Dynamic Light Scattering Instruments
Scanning Probe Microscopes (SPM)
Electrical Conductivity Measurement Systems
Scratch Testers
Electron Backscattered Diffraction (EBSD) Systems
Separation Membranes
Ellipsometers
Spectrofluorometers
Energy Dispersive X-Ray Spectroscopy (EDS)
Spectrometers
Flow Chemistry Reactors
Spectrophotometers
Focused Ion Beam (FIB) Accessories
Spectroscopic Ellipsometers
Focused Ion Beam (FIB) Systems
Sputtering Systems
FT-IR and FT-NIR Spectrometers
Streak Cameras
Helium Ion Beam Microscopes (HIM)
Surface Area Analyzers
Induction Heating
TEM Sample Holders and Supplies
Micro Hardness Testers
Thermal Analysis Equipment
Microfluidic Devices
Thermal Desorption Equipment
Micropositioning Systems
Thin Film and Coating Thickness Measurement Tools
Mills for Reducing Particle Size
Thin-Film Deposition Systems
Moisture Analyzers
Time Delay Inegration (TDI) Cameras
Nanofiber Production Equipment
Transmission Electron Microscopes
Nanoimprint Lithography Equipment
Tribometers - Friction and Wear Testers
Nanoimprint Lithography Templates
Ultrasonic Processing Equipment
Nanoindentation Testers
Vibration Isolation Systems
Nanolithography Systems
Wafer Bonders
Nanoparticle Characterization Systems
X-Ray Cameras
Nanoparticle Production Systems
X-Ray Diffractometers
Nanopositioning Systems
X-Ray Fluorescence Analyzers
Optical Characterization Systems
Zeta Potential Analyzers