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Cypher ES™ from Asylum Research - Atomic Force Microscope with Environmental Control

Cypher ES™ from Asylum Research - Atomic Force Microscope with Environmental Control

Cypher™ is the first commercial AFM to take advantage of the high bandwidth and low noise performance of smaller cantilevers, and is the only commercial AFM to routinely resolve atomic point defects and the DNA helix.

Now, Asylum Research introduces the Cypher ES™, which adds full environmental control to the Cypher family.

The heart of the Cypher ES is based around a cell constructed of inert materials, such as fused silica and FFKM, to enclose and control the sample environment.

The modular design allows customization for measurements in nearly any environment.

Gas/Fluid Perfusion in a Sealed Cell

  • Multiple ports for flow-through of gas and/or fluid
  • Perfusion may be performed in a droplet to minimize sample volume (<20µl) and cell cleaning
  • Simple gravity driven perfusion – no pumps are required

Integrated Temperature Control

  • Modular sample stages enable precise temperature control in several temperature ranges
  • No external boxes, additional electronics, or cooling pumps are required

Broad Chemical Compatibility

  • Ensuring chemical compatibility even in the harshest environments, cells are constructed with inert materials:
    • Fused silica
    • Perfluoroelastomer (FFKM)
    • PEEK
  • Suitable for solvents, acids, bases, buffers, inert gases

User Testimonials

The Cypher is the best AFM I have ever used. For our group it has allowed seamless integration of spectroscopic modes for probing contact mechanics in polymers, ionic diffusion in energy storage and generation materials, and polarization switching in ferroelectrics and multiferroics in one flexible, high-stability platform. Cypher makes the work we do possible.

Stephen Jesse, Oak Ridge National Laboratory

I have to say, if we did not have a Cypher with its unrivaled PFM sensitivity, we could not have gotten the data that finally convinced the referees. Thank you very much!

Prof Di WU, Nanjing University, China

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