The highly affordable NewView™ 700s provides fast, noncontact, three-dimensional inspection and quantitative surface topography measurement for both research and production applications. Using ZYGO's patented scanning white-light interferometry (SWLI) technology, the NewView™ 700s easily measures a wide range of surfaces, including smooth, rough, flat, sloped and stepped surfaces.
Based on white light phase-shifting interferometry, NewView™ 700p provides precise, low-cost 3D profiling, and is ideally suited for fast, high resolution measurements on various smooth surfaces, including optics, silicon wafers, ceramics, polished hard disks, and more. The system is exceptionally cost-effective and compact, conserving your budget and valuable floor space.
Fast, noncontact 3D surface measurements
Sub-angstrom vertical resolution
Simple, flexible functionality
Cost-effective, compact platform