The highly affordable NewView™ 700s provides fast, noncontact, three-dimensional
inspection and quantitative surface topography measurement for both research
and production applications. Using ZYGO's patented scanning white-light interferometry
(SWLI) technology, the NewView™ 700s easily measures a wide range of surfaces,
including smooth, rough, flat, sloped and stepped surfaces.
Based on white light phase-shifting interferometry, NewView™ 700p provides
precise, low-cost 3D profiling, and is ideally suited for fast, high resolution
measurements on various smooth surfaces, including optics, silicon wafers, ceramics,
polished hard disks, and more. The system is exceptionally cost-effective and
compact, conserving your budget and valuable floor space.
- Fast, noncontact 3D surface measurements
- Sub-angstrom vertical resolution
- Simple, flexible functionality
- Cost-effective, compact platform