The extremely compact Keysight 8500B field-emission scanning electron microscope (FE-SEM) has been designed for low-voltage imaging, very high surface contrast, and resolution.
This ground-breaking, technologically advanced system also provides fully integrated energy dispersive spectroscopy (EDS) capabilities, facilitating quantitative elemental analysis to be carried out on arbitrary points, in a user-defined regional map, or on a continuous line scan. It is capable of detecting elements as light as carbon, up to americium.
The plug-and-play 8500B is easy to install. It has been designed for use in almost any lab and requires just an AC power outlet. The novel, scientific-grade system provides several low-voltage imaging methods that improve surface contrast and permit nanoscale features to be monitored on a broad range of nanostructured materials, including thin films, biomaterials, polymers, and other energy-sensitive samples on any substrate, even glass.
Key Features and Specifications
- Imaging and resolution equivalent to that of conventional FE-SEMs
- Variable low voltage minimizes the need to conductively coat samples
- Fully integrated EDS capabilities allow quantitative elemental analysis
- Electrostatic lens design guarantees repeatable performance without regular re-tuning
- Programmable X/Y/Z stage allows users to set precise coordinates, scan, and save locations
- Easy installation in any research lab is possible due to its compact size (special facilities are not required)