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FEI Quanta 50 Series Scanning Electron Microscope

The FEI Quanta family includes six variable-pressure and environmental scanning electron microscopes (ESEM) and two DualBeam systems, all of which can accommodate multiple sample and imaging requirements for industrial process control labs, materials science labs and life science labs.

The FEI Quanta family are versatile, high-performance scanning electron microscopes, with three modes (high vacuum, low vacuum and ESEM) to accommodate the widest range of samples of any SEM system. All the SEM systems can be equipped with analytical systems, such as energy dispersive spectrometer, wavelength dispersive x-ray spectroscopy and electron backscatter diffraction.

The FEI Quanta 50 series provides flexibility and versatility to handle the challenges of today's wide ranging research needs. View any sample and get all the data - surface and compositional images can be combined with accessories for determining material properties and elemental composition.

The FEI Quanta 50 series adds new features such as SmartSCAN, Multiple Image Saving and a scan preset toolbar to the easy to use control software. In addition, new features are available like the Nav-Cam (color sample camera), Beam Deceleration (low kV performance) and New detector options.

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