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FEI PSEM eXplorer Scanning Electron Microscope

FEI PSEM eXplorer Scanning Electron Microscope

Now in its third generation, the PSEM eXplorer is designed for the automated imaging and elemental analysis of a wide spectrum of surfaces and particulate. A unique blend of hardware ruggedization and software sophistication creates a system platform that is readily accessible.

Industrialized by Design

The following founding manufacturing philosophies enable FEI units to be installed where the competition has never been:

  • Stability & Reproducibility
  • Minimized Downtime
  • Reliability & Serviceability
  • Evolved Staging
  • Environmental Shielding
  • Ease of Use
  • Guaranteed Performance

Seamless Solutions for Microanalysis

Each FEI PSEM eXplorer comes equipped with the Perception software suite, which provides a powerful set of productivity tools for microanalysis. When coupled with optional FEI software such as ...

  • AFA Automated Feature Analysis
  • CFA Complex Feature Analysis
  • MQA Metal Quality Analysis
  • GSR Gun Shot Residue Analysis

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