SPM Systems with more than one probe that can image independently have always
been a dream. This dream has become a reality with the MultiView
4000™ with its AFM, NSOM and SPM multiprobe capabilites and it's optical
and electron optical compatibility.
Key features of Nanonics
MultiView 4000™ include:
- Independent scanning of up to four probes for atomic force, near-field optical
and all known probes for scanned probe imaging modes
- Unique probes for multiple probe resistance measurements with two, three
and four point probe geometries
- Unique thermal probes for multiple probe measurements
- Multiple probe near-field optical (NSOM or SNOM) measurements
- Multiple probe nanochemical writing on a variety of structures with a variety
of gaseous, liquid or solid inks with Fountain Pen Nanochemistry™
- Multiple probe nanoindentation with on-line ultra high resolution atomic
force imaging of the indented structure
- Multiple probe optical or thermal desorption with tandem collection for
mass spectral analysis