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Posted in | Scanning Near-Field Optical Microscopes (SNOM) | Scanning Probe Microscopes (SPM) | Atomic Force Microscopes (AFM)

Nanonics MultiView 4000

Nanonics MultiView 4000
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与超过可能图象总是独立地是梦想的一探测的 SPM 系统。 此梦想成为与 MultiView 4000™的一个事实与其 AFM， NSOM 和 SPM multiprobe capabilites 和它是光学和电子光学兼容性。

Nanonics MultiView 4000™关键功能包括：

  • 基本光学强制、的近域和所有已知的探测的四探测独立扫描浏览的探测想象模式的
  • 多个探测阻力评定的唯一探测与二，三和四点探测几何
  • 多个探针测量的唯一上升暖流探测
  • 多个探测近域光学 (NSOM 或 SNOM) 评定
  • 多个在各种各样的结构的探测 nanochemical 文字与与钢笔 Nanochemistry™的各种各样的气体，液体或者固态墨水
  • 与缩进的结构的在线超高分辨率基本强制想象的多个探测 nanoindentation
  • 多个与纵排收藏的探测光学或热量解吸附作用的质量光谱分析

Last Update: 11. January 2012 07:57

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