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Park Systems XE-BIO Atomic Force Microscope

Park Systems XE-BIO Atomic Force Microscope

XE-Bio is a powerful 3-in-1 nanoscience research tool that uniquely combines industry's only True Non-Contact AFM with Ion Conductance Microscopy (ICM) and inverted optical microscope on the same platform. The modular design of the XE-Bio allows easy exchange between non-contact AFM and ICM. Designed for non-invasive in-liquid imaging, the combined imaging capability of AFM, ICM, and inverted optical microscopy makes the XE-Bio ideal for imaging biological samples, such as living cells, in dynamic conditions. Moreover, ICM can be adapted to enable a host of powerful applications in nanoscale electrophysiology.

Powerful 3-in-1 Nanoscale Research Tool with Modular Platform

  • True Non-Contact Atomic Force Microscope (AFM)
  • Ion Conductance Microscope (ICM)
  • Inverted Optical Microscope

Ultimate AFM Resolution by True Non-Contact Mode

  • 10 times larger Z-scan bandwidth than a piezotube
  • Less tip wear for prolonged high-quality and high-resolution imaging
  • Minimized sample damage or modification
  • Immunity from parameter-dependent results observed in tapping imaging
  • Single molecule Force-Distance spectroscopy with automated data analysis

Non-invasive In-liquid Imaging by ICM

  • Monitoring ion channels of single living cells
  • Unique functional capability of targeted localized stimulation
  • Enable nanoscale patch-clamping for electrophysiology
  • Environmental chamber for temperature, pH, and humidity control

Fully Integrated Inverted Optical Microscope

  • Compatible with phase contrast and DIC imaging
  • Also compatible with fluorescence microscopy
  • Advanced image overlay functions

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