XE-70 is Park Systems' AFM solution for researchers with limited budget. XE-70 does not compromise any of the innovative technologies of the XE-series that sets it apart from conventional AFMs, supporting the same modes, options, and electronics as all other systems in the XE product line.
Artifact Free Imaging by Crosstalk Elimination
- Two independent, closed- loop XY and Z flexure scanners for sample and tip
- Flat and linear XY scan of up to 100 µm x 100 µm with low residual bow
- Out of plane motion of less than 2 nm over entire scan range
- Up to 25 µm Z-scan by high force scanner
- Accurate height measurements
Ultimate AFM Resolution by True Non-Contact Mode
- 10 times larger Z-scan bandwidth than a piezotube
- Less tip wear for prolonged high-quality and high-resolution imaging
- Minimized sample damage or modification
- Immunity from parameter-dependent results observed in tapping imaging
User Convenience by EZ Design
- Open side access for easy sample or tip exchange
- Dovetail-lock mount for easy head removal
- Direct on-axis optics for high resolution optical viewing