Park Systems XE-70 Atomic Force Microscope

XE-70 is Park Systems' AFM solution for researchers with limited budget. XE-70 does not compromise any of the innovative technologies of the XE-series that sets it apart from conventional AFMs, supporting the same modes, options, and electronics as all other systems in the XE product line.

Artifact Free Imaging by Crosstalk Elimination

  • Two independent, closed- loop XY and Z flexure scanners for sample and tip
  • Flat and linear XY scan of up to 100 µm x 100 µm with low residual bow
  • Out of plane motion of less than 2 nm over entire scan range
  • Up to 25 µm Z-scan by high force scanner
  • Accurate height measurements

Ultimate AFM Resolution by True Non-Contact Mode

  • 10 times larger Z-scan bandwidth than a piezotube
  • Less tip wear for prolonged high-quality and high-resolution imaging
  • Minimized sample damage or modification
  • Immunity from parameter-dependent results observed in tapping imaging

User Convenience by EZ Design

  • Open side access for easy sample or tip exchange
  • Dovetail-lock mount for easy head removal
  • Direct on-axis optics for high resolution optical viewing
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