Park Systems XE-120 Atomic Force Microscope

Take the award-winning XE-100, shrink it such that it can be placed on top of the many popular inverted optical microscopes, and you have the versatile XE-120, an exceptional AFM with expanded sample and interactivity flexibility. The XE-120 is the research grade AFM with industry's only True Non-Contact mode imaging for both air and liquid imaging. Flexible configurations allow integration with other advanced optical measurement techniques such as Raman spectroscopy.

Artifact Free Imaging by Crosstalk Elimination

  • Two independent, closed- loop XY and Z flexure scanners for sample and tip
  • Out of plane motion of less than 2 nm over entire scan range
  • Flat and linear XY scan of up to 100 µm x 100 µm with low residual bow
  • Up to 25 µm Z-scan by high force scanner
  • Accurate height measurements

Ultimate AFM Resolution by True Non-Contact Mode

  • 10 times larger Z-scan bandwidth than a piezotube
  • Less tip wear for prolonged high-quality and high-resolution imaging
  • Minimized sample damage or modification
  • Immunity from parameter-dependent results observed in tapping imaging

User Convenience by EZ Design

  • Open side access for easy sample or tip exchange
  • Dovetail-lock mount for easy head removal
  • Direct on-axis optics for high resolution optical viewing
  • Motorized optics stage

Advanced Optical Integration and Option Compatibility

  • Integrated with inverted optical microscopes
  • Tight mechanical coupling yields excellent noise performance
  • Compatible with both reflection and transmission optical viewing
  • Open side access for optical coupling such as Raman spectroscopy for TERS
  • Access to all advanced SPM modes and options
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