Take the award-winning XE-100,
shrink it such that it can be placed on top of the many popular inverted optical
microscopes, and you have the versatile XE-120,
an exceptional AFM with expanded sample and interactivity flexibility. The XE-120
is the research grade AFM with industry's only True Non-Contact mode imaging
for both air and liquid imaging. Flexible configurations allow integration with
other advanced optical measurement techniques such as Raman spectroscopy.
Artifact Free Imaging by Crosstalk Elimination
- Two independent, closed- loop XY and Z flexure scanners for sample
and tip
- Out of plane motion of less than 2 nm over entire scan range
- Flat and linear XY scan of up to 100 µm x 100 µm with
low residual bow
- Up to 25 µm Z-scan by high force scanner
- Accurate height measurements
Ultimate AFM Resolution by True Non-Contact Mode
- 10 times larger Z-scan bandwidth than a piezotube
- Less tip wear for prolonged high-quality and high-resolution imaging
- Minimized sample damage or modification
- Immunity from parameter-dependent results observed in tapping imaging
User Convenience by EZ Design
- Open side access for easy sample or tip exchange
- Dovetail-lock mount for easy head removal
- Direct on-axis optics for high resolution optical viewing
- Motorized optics stage
Advanced Optical Integration and Option Compatibility
- Integrated with inverted optical microscopes
- Tight mechanical coupling yields excellent noise performance
- Compatible with both reflection and transmission optical viewing
- Open side access for optical coupling such as Raman spectroscopy
for TERS
- Access to all advanced SPM modes and options