The highly successful X-Max 80 detector is now available for use on Transmission
Electron Microscopes! This detector has solid angles significantly greater than
any commercially available SDD for TEM. X-rays are collected faster due to greater
collection efficiency, and the count handling capability of SDD. See the difference
immediately when analysing nanoparticles, or collecting linescans or X-ray maps.
The X-Max TEM will increase productivity without sacrificing accuracy - all
in a liquid nitrogen free environment.
Benefits
X-Max TEM offers all the advantages of large area SDD detectors
Detector Technology
- 80mm2 very large area sensor with excellent performance at high count rates
offers unparalleled speed of data collection
- Higher spectral resolution even at high count rates allows for the detection
of elements as low as Be
- Accepts higher count rates without flooding the detector (e.g. crossing
grid bars or thick metallurgical samples)
- Peltier cooling for fast cool down times and safety
- Automatic retraction behind flap to protect against high electron flux
Large solid angle
- Decrease in analysis time for point acquisition, linescans and maps
- Handle higher count rates without the loss of accuracy to achieve better
results in shorter count times
- Analysis of nanoparticles made easier due to increased collection efficiency
Liquid Nitrogen Free
- Safer working environment with no need to fill detector with LN2
- Cost efficiency - no LN2 required
- No need to wait for a 'warm' detector to cool. X-Max is stable for the
most precise analysis within a few minutes
Features
- Unique single sensor large area SDD
- 80mm2active area
- Throughput > 200,000 cps
- MnKa typically 125eV
- Be detection
- Vacuum enclosed sensor to reduce oxygen absorption
- Only one pulse processing channel required
- Optimised geometry for TEM
- Motorised slide as standard