The SIGMA,
featuring GEMINI® technology provides outstanding imaging and analytical
results from a field emission microscope.
The SIGMA
is now available with variable pressure (VP) technology for exceptional imaging
and analysis of non-conductive specimen. It is compatible with a wealth of accessories
including the class leading Carl Zeiss BSD and VPSE G3 detectors for superior
materials contrast and SE imaging in VP.
SIGMA–
Key Benefits
Analytical Platform
- Simultaneous EDS and EBSD analysis
- Universal WDS port as standard providing flexibility for a comprehensive
range of acces
- sories Extended stage travel for handling of large specimen
- Class leading analytical and X-ray geometry
Best in class imaging with GEMINI® Technology
- Outstanding imaging and ease of use using the high performance GEMINI®
column
- High purity, In-lens, SE detection for true surface imaging
- Excellent imaging at low voltages for beam sensitive and non-conducting
specimen
- Investigation of magnetic samples with GEMINI® objective lens design
for distortion free imaging
Ease of Use
- Unique column design providing superb imaging for both experts and novices
alike
- Advanced Navigation allowing for high productivity and throughput
- SmartSEM® Interface for intuitive operation of the SEM
FESEM providing unrivaled versatility
- Advanced VP technology for exceptional imaging and analysis of non-conductive
specimen
- Seamless switching between high vacuum and variable pressure vacuum modes
- Upgradeability with large range of Carl Zeiss detectors