The XE-NSOM
is specially designed and tailored for advanced optical measurements including
Near-field Scanning Optical Microscopy (NSOM) and Raman Spectrometry. The XE-NSOM
offers a complete AFM system setup with unprecedented adaptability for these
optical experiments. The high-performance Z-servo scanner of the XE-NSOM
supports True Non-Contact AFM and utilizes cantilever-based closed-loop feedback
technology.
Features
- Seamless integration of AFM and optical measurements
- Upgradeable modular design supports AFM, NSOM and Raman Spectroscopy
- Versatility supporting various reflection/transmission modes
- Optical head design provides convenient experimental access to the sample
- Easy alignment of optical axes to the photon detection system