The EVO®
HD features a new electron source technology facilitating unmatched low-kV
resolution. This makes the EVO®
HD the premier choice for challenging specimens, the imaging of surface
detail or for beam-sensitive materials. The resolution improvements at higher
probe currents provide enhanced analytical accuracy.
This technology demonstrates unchallenged performance in the conventional SEM
(C-SEM) arena and as a result the EVO®
HD dramatically improves on the imaging resolution currently achievable
in C-SEM. With this step-change in resolution, the EVO®
HD now advances knowledge in those applications that were previously limited
in conventional SEMs such as :
- Nano Materials
- Fracture Mechanics
- Geological Applications
- Microbiology