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CSM Instruments Ultra Nanoindentation (UNHT)

CSM Instruments offers a nano-range high resolution nanoindenter with ultra low thermal drift - now available with high temperature/high vacuum options. When used per ISO 14577 test methods the Ultra Nano Hardness Tester is able to measure the most accurate data of any other instruments on the market.

The nano indentation technique is identified as Depth-Sensing Indentation (DSI), as the penetration depth is continuously monitored as a function of load during the indentation test. This technique has been largely practiced to evaluate mechanical properties of materials at the nanoscale level, especially hardness and elastic modulus. Given the range of depths (nm) and forces (£gN) involved, the highest accuracy of the measured penetration depth and applied force over time is therefore indispensable for this method. Accuracy and precision of the data are assured by having the lowest thermal drift available of any instrumented nanoindenter.

Features

  • Active top referencing (Patented Design)

    The reference is removable and can be of different shapes (ball, pin, etc). The reference has its own piezo actuator and load sensor and applies a very small controlled (servo loop) load on the sample.

  • Thermal drift free

    The head is constructed out of ZeroDur® glass and the electronics system has a drift rate of ≈ 1ppm/°C

  • Highest load frame stiffness

    Thanks to the marble base platform, the choice of materials (ZeroDur) and the patented active top referencing.

  • Two independent depth and load sensors

    Ultra high resolution capacitive sensors for True Depth and Load Control modes.

  • Ultra high resolution and very low noise floor

    Depth resolution: 0.001 nm, noise floor ≈ 0.1nm
    Force resolution: 0.01 μN, noise floor ≈ 0.5µN

  • Perfect positional synchronization

    The Ultra Nanoindentation Tester is perfectly “positionally synchronized” with a high quality optical video microscope and/or an optional Atomic Force Microscope (AFM). The combination of the Ultra Nanoindentation Tester head, the optical microscope and the AFM objective provides great flexibility and ease-of-use, as well as accurate three-dimensional imaging at the nanometer scale.

  • Compliant to ISO 14577 and ASTM E2546

    CSM Instruments produces instruments and measurements that conform perfectly to ISO and ASTM standards

Options

  • High temperature stages up to 200°C or 400°C (400°C under vacuum only)
  • Vacuum or environmental control enclosure
  • Acoustic damping enclosure
  • Atomic Force Microscope
  • High resolution sample stage (0.25um accuracy)
  • High resolution camera
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