Multimode Atomic Force Microscope (AFM) - Multimode 8 from Bruker

Multimode Atomic Force Microscope (AFM) - Multimode 8 from Bruker

The MultiMode® 8 Atomic Force Microscope (AFM) from Bruker is everything you would expect from the extraordinary MultiMode microscope platform that has set the standard for high-resolution atomic force microscopy imaging for over 15 years. Now, the latest MultiMode 8 AFM system incorporates surprising new features and accessories that take the distinguished MultiMode Atomic Force Microscope platform to even higher levels of performance, speed, and ease of use.

Highest Performance and Resolution

  • Rigid mechanical design and state of the art low-noise, high-bandwidth NanoScope® V controller electronics combine to enable ultra-high resolution and revolutionary imaging modes like ScanAsyst®, ScanAsyst-HR and PeakForce QNM®
  • Bruker's exclusive Peak Force Tapping® technology enables exceedingly low tip-sample interaction forces— even lower than was possible with TappingMode™

Faster and More Productive

  • The NEW high-speed ScanAsyst-HR is now available, enabling fast scanning on the MultiMode 8 AFM system. Enjoy up to 20X faster survey scan rates and up to 6X faster scans with no loss of resolution

Versatility to Satisfy More Applications

  • The MultiMode 8 AFM is equally well suited for imaging in both air and fluid
  • A full range of temperature and environmental control accessories are available for the MultiMode 8 AFM system
  • A large variety of standard operating modes and many unique capabilities enable the MultiMode 8 AFM system to characterize everything from mechanical to electrical properties

Easier Expert-Quality Results

  • Bruker's proprietary ScanAsyst atomic force microscopy scan technology mode offers automatic image optimization for faster, more consistent results. It will continuously adjust scan rate, setpoint and gains to obtain the highest quality image
  • Imaging in fluid has never been easier. There's no need for cantilever tuning and ScanAsyst continuously monitors the tip-sample interaction force, thereby eliminating setpoint drift

Exclusive & Powerful Quantitative Imaging Modes

  • PeakForce QNM enables direct mapping of nanomechanical properties, including elastic modulus, adhesion and dissipation, at high resolution and normal scan rates. The data channels are quantitative and unambiguous, unlike conventional phase imaging and some competing multi-frequency techniques
  • PeakForce TUNA™ enables quantitative conductivity mapping on delicate samples that can't be imaged with conventional conductive AFM

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