In high-end research AFM, performance and
flexibility are the top design criteria. Common
UHV SPMs are very specialized and far behind
the ease of use of today’s standard AFMs or
With the DME UHV SPM, we bring flexibility and
usability into ultra high vacuum applications: Use
the variety of standard AFM cantilevers for your
UHV experiments and jump over the limitation of
necessarity for specialized tips. Obtain highest
physically possible resolved images.
Anchored Stage™ technology enables coarse
movement between SPM tip and sample without
any negative influence on system stability. With a
mechanical loop of no more than 3 cm, you obtain
the best possible single atomic resolution.
DME has united the demand for ultimate
performance with so far unknown level of handling
comfort in the field of UHV SPM systems.
- A remote controlled laser/detector alignment
combined with a single linear transfer for sample
and cantilever exchange supports extreme easy
handling and highest throughput.
laser and detector electronics guarantee low noise
and reliable detection of the cantilever deflection.
- The approved RasterScope™ sample scanner technology stands for
stability in the last decades.
- An integrated CCD camera and optics enable
a top down view onto the cantilever and the
- Direct visual access enable remote
controlled XY tip-sample navigation via a
software integrated video image.
- The freely suspended, vibration isolated SPM
stage guarantees artifact free measurements
also in noisy environments.
- A standard DN 250 CF flange mount
enables an implementation as plug and play
solution on your already existing UHV
system or the operation in a stand alone UHV
- Two additional feed throughs are available for
additional observation equipment or sample
excitation by laser or other light sources.
- By its laser deflection detection system, the DME
UHV SPM is able to operate in all major SPM
- Frequency modulation (FM) based imaging
modes support utilization of high Q cantilevers.
- 4 free user defineable electrical feed-throughs on
sample and cantilever side support many kinds of
electrical measurements as well as usage of
active cantilevers or other probes like thermal
cantilevers, akiama probes, quartz tuning fork
sensors or etched STM wire tips.
The DME UHV SPM means AFM measurements
without compromises in ultra high vacuum. Achieve
highest sample throughputs and measurement
comfort nearly like in air. The new DME UHV SPM
will multiplicate your working speed under UHV