Nanosurf & Kleindiek AFM for SEM - Combined Scanning Electron and Atomic Force Microscopy

A new and advanced plug-and-play retrofit solution is being offered by Nanosurf and Kleindiek. The combined functions of Scanning Electron Microscopes (SEM) and Atomic Force Microscopy (AFM) open up a new level of possibilities.

SEMs are generally utilized for analytics in the nanometer and micrometer range, while AFM methods are used for exploring the characteristics and surfaces of different types of materials down to nanometer detail.

Key Features

The product features of the AFM for SEM are:

  • 3D information from concurrent AFM and SEM pictures
  • Convenient sample and tip exchange eliminates the need for laser adjustments
  • Extremely compact (height 10 mm)
  • Load-lock compatible
  • Easy to operate
  • Stable operation
  • Compatible with micromanipulators and other in-situ and ex-vivo systems
  • Operates in air and in SEM
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