Posted in | Atom Probes

C11627-01: Optical NanoGauge Non-Contact Film Thickness Measurement Device

C11627-01: Optical NanoGauge Non-Contact Film Thickness Measurement Device

The C11627-01 Optical NanoGauge available from Hamamatsu is a noncontact film thickness measurement device that uses spectral interferometry. The device includes an optical fiber as well as a main unit incorporating a mini-spectrometer, light source, and data analyzer within a small package.

The compact and space-saving design of the C11627-01 makes it easy to integrate in a customer's system. The C11627 effortlessly handles different types of measurement objects and materials. There are no complex reference measurements because the C11627-01 is reference free and offers high-speed and highly precise measurements that remain stable even after continuous use.

Key Features

The product features of the C11627-01 Optical NanoGauge are:

  • Compact and saves space
  • Reference free
  • High accuracy and high speed
  • Standalone operation with external units
  • Analyzes optical constants (n, k)
  • Easily handles height variations

Applications

The applications of the C11627-01 Optical NanoGauge are:

  • Semiconductor material – thin film, wafer film
  • Thickness/color measurement of FPD panel
  • Coating film
  • Plastic film
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