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CSM Instruments Atomic Force Microscope

CSM Instruments offers scanning probe microscope or atomic force microscope, a technique designed for analysing surface topography on the nanoscale. A fine sensor tip placed at the end of a deflecting cantilever is made to contact the surface of the sample. It moves from corner to corner, producing a 3D image of the surface with high resolution. This method can be used for imaging indentations, residual scratches as well as for measuring the dimensions of nanoscale surface.

Key Features

The key features of the atomic force microscope are:

  • Determination of micro or nanostructures
  • Profile analysis of thin films and coatings
  • Analysis of roughness of surfaces and etched structures
  • Critical Dimension measurements
  • Opens new opportunities for quantitative characterization of visual surface by combining optical and scanning probe microscopy
  • Assessment of surfaces with minimal optical contrast
  • Identification of fragile biological tissue and other applications in surface research and materials
  • Optical inspection of sample areas

Optional Equipment

The optional equipment available for the scanning probe microscopy are:

  • Conductive Force Microscopy
  • Electrostatic Force Microscopy
  • Liquid cell
  • Lateral Force Microscopy
  • Magnetic Force Microscopy
  • Non-contact Mode
  • Pulsed Force Mode
  • Scanning Thermal Microscopy
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