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Hysitron PI 87 SEM PicoIndenter® Depth-Sensing Indenter

Hysitron’s PI 87 SEM PicoIndenter is a depth-sensing indenter that is specifically designed for a scanning electron microscope (SEM), with an electrically conductive probe and a vacuum-compatible transducer.

The system can be interfaced with a SEM or FIB/SEM and is designed to perform quantitative nanomechanical testing and concurrent imaging with the SEM. The low-current design of the system offers low thermal drift and excellent sensitivity and stability.

In addition, sample positioning with five degrees of freedom i.e., X, Y, Z, tilt and rotation allows users to align the sample with various detectors for advanced analysis or with an ion beam for sample preparation and modification.

For top-down imaging, the sample can be aimed directly at the e-beam. This is obtained without breaking the vacuum and exposing the sample to atmosphere, which is important for preventing oxidation of particular materials. This improved flexibility reduces analysis time and saves valuable time spent on the microscope.

Key Features

The main features of the PI 87 SEM PicoIndenter are:

  • Can be interfaced with SEM.
  • Excellent flexibility.
  • Sample positioning with five degrees of freedom.
  • Seamless pre- and post-test EBSD mapping.
  • Performs quantitative nanomechanical testing and simultaneous imaging with the SEM.
  • Includes vacuum-compatible transducer and electrically conductive probe.
  • Tilt and rotation stages ensure that additional detectors are within reach for advanced analysis throughout the mechanical test.
  • Reduces analysis time.
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