Highly Accessible Atomic Force Microscope (AFM) - Ardic Instruments P100

Highly Accessible Atomic Force Microscope (AFM) - Ardic Instruments P100

The P100 AFM from Ardic Instruments has a sub-nanometer Z-axis resolution, making it ideal for high resolution imaging and measurement. Ardic's unique astigmatic optical design produces a small 0.56um laser spot size, allowing users to experiment with smaller and faster AFM cantilevers. The integrated low-noise and open-loop scanner allows for quick and effective experiments up to 15μm by 15μm.

The P100 ships with Ardic's intuitive PSX control software, which allows the user to collect high-quality data with minimal training. The One-Click Scan feature automates the setup and scan process, allowing users to quickly obtain high quality scan results. The built-in scan library management feature simplifies the flagging of scan data and allows the user to easily delete or export scans.

Key Features

  • 0.3nm Z Spatial Resolution

  • 0.53um Laser Spot Size

  • 15um x 15um Open-Loop Scan Range

  • Perpetually Aligned Optical Design - Laser and detector require no alignment

  • Fast Setup - Out of the box, the system takes only minutes to set up and begin the first scan.

  • Multilingual Software (English/Chinese/Japanese/Korean/Spanish/German)

  • One-click Scan - Automatically tune, approach the surface, calibrate the force curve, and scan the sample in a single click enabled by smart predictive algorithms

  • Simple Probe Loading

P100 Atomic Force Microscope from Ardic Instruments

The P100 AFM from Ardic Instruments has a sub-nanometer Z-axis resolution, making it ideal for high resolution imaging and measurement.
Ardic's unique astigmatic optical design produces a small 0.56um laser spot size, allowing users to experiment with smaller and faster AFM cantilevers.
The integrated low-noise and open-loop scanner allows for quick and effective experiments up to 15μm by 15μm.
The P100 ships with Ardic's intuitive PSX control software, which allows the user to collect high-quality data with minimal training.
The One-Click Scan feature automates the setup and scan process, allowing users to quickly obtain high quality scan results.
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