Site Sponsors
  • Park Systems - Manufacturer of a complete range of AFM solutions
  • Strem Chemicals - Nanomaterials for R&D
  • Oxford Instruments Nanoanalysis - X-Max Large Area Analytical EDS SDD

300kV Field-Emission TEM (FE-TEM) with High Spatial and Energy Resolution – HF-3300 from Hitachi

The 300 kV HF-3300 TEM/STEM combines cold field emission gun (CFEG) technology pioneered by Hitachi with novel functions such as parallel nanobeam electron diffraction, spatially-resolved EELS, and double-biprism electron holography.

The high beam current density and the superior energy resolution of the CFEG necessitates a monochromator for high energy resolution spectroscopy. High coherence and brightness of the CFEG along with the double-biprism electron holography make the HF-3300 the best electron holography instrument for one’s laboratory.

Key FeaturesThe key features of the HF-3300 are:

  • The excellent imaging modes of the HF-3300 produce an ideal tool for high resolution and analytical materials science. TEM, STEM (BF, HAADF), SEM (at 300 kV or lower), EDX/EELS spectroscopic imaging, and electron holography imaging, as well as high sensitivity high energy resolution EDX and EELS provide both structural and chemical information for materials study.

  • The HF-3300 has special configurations for in-situ environmental TEM.

  • Sharing HF-3300 specimen holders with Hitachi FIB systems (NB5000, FB2200) make sample preparation and TEM study a highly efficient data pipeline.

  • It has a cold field emission electron source

  • The accelerating voltage is a maximum of 300 kV

  • It has a resolution of 0.10 nm (lattice), 0.19 nm (point-to-point) and magnification of 200x - 1,500,000x

Ask A Question

Do you have a question you'd like to ask the manufacturer of this equipment or can you provide feedback regarding your use of this equipment?

Leave your feedback
Submit
Other Equipment by this Supplier
Other Equipment