The SU3500 scanning electron microscope features innovative electron optics and signal detection systems affording unparalleled imaging and analytical performance. Designed with intuitive logic, the new user-friendly GUI offers excellent image observation and display functions.
Engineered for a wide range of applications, including biological specimens and advanced materials, the SU3500 will surely be the workhorse microscope in any laboratory.
The key features of the Hitachi SU3500 VP-SEM are:
Unparalleled image quality—All new electron optics design with best-in-class image sharpness
Intuitive operation—Wide-screen GUI and fast auto image optimization functions (7 seconds) via "delegation" technology
Ultra variable-pressure detector—Image surface information at low vacuum and low accelerating voltages
Stereoscopic image function—Point and click for seamless, real-time "3D" image observation
The electron optics design yields unmatched imaging performance achieving high resolution at low accelerating voltage.