High-End Variable Pressure Scanning Electron Microscope – Hitachi SU3500 VP-SEM

High-End Variable Pressure Scanning Electron Microscope – Hitachi SU3500 VP-SEM

The SU3500 scanning electron microscope features innovative electron optics and signal detection systems affording unparalleled imaging and analytical performance. Designed with intuitive logic, the new user-friendly GUI offers excellent image observation and display functions.

Engineered for a wide range of applications, including biological specimens and advanced materials, the SU3500 will surely be the workhorse microscope in any laboratory.

Key Features

The key features of the Hitachi SU3500 VP-SEM are:

  • Unparalleled image quality—All new electron optics design with best-in-class image sharpness
  • Intuitive operation—Wide-screen GUI and fast auto image optimization functions (7 seconds) via "delegation" technology
  • Ultra variable-pressure detector—Image surface information at low vacuum and low accelerating voltages
  • Stereoscopic image function—Point and click for seamless, real-time "3D" image observation
  • The electron optics design yields unmatched imaging performance achieving high resolution at low accelerating voltage.
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