Site Sponsors
  • Technical Sales Solutions - 5% off any SEM, TEM, FIB or Dual Beam
  • Park Systems - Manufacturer of a complete range of AFM solutions
  • Oxford Instruments Nanoanalysis - X-Max Large Area Analytical EDS SDD
  • Strem Chemicals - Nanomaterials for R&D

STEM for Nanoscale Analysis – High Performance, High Resolution HT7710 from Hitachi

With over 70 years of microscopy innovation, Hitachi offers the HT7710 STEM with maximum performance and productivity for in-situ analysis. The HT7710's radical design includes the user-friendliness and ergonomics of a SEM with the advanced resolution and analytical capabilities of a TEM/STEM.

It features completely digital imaging supported by a redesigned viewing chamber which accommodates Hitachi’s brightfield and darkfield STEM detectors.

Key Features

The key features of the HT7710 are:

  • STEM Performance for Soft/Hybrid Materials—40-120kV with a magnification range of 100-800,000X and image recording resolutions up to 5120 X 3840

  • High Magnification and Large FOV STEM—Ideal for high-resolution lattice imaging, bulk crystal structure, and nanoparticle analysis

  • Flexible Port Configurations—BF/DF STEM, EDS detectors, and cameras for high-throughput imaging and compositional data

  • Intuitive STEM GUI and Automation Features—All STEM images instantly archived in Hitachi’s EMIP database software

  • Optional High-Resolution Objective Lens– 1.4Å at low accelerating voltages with minimal beam damage

Ask A Question

Do you have a question you'd like to ask the manufacturer of this equipment or can you provide feedback regarding your use of this equipment?

Leave your feedback
Submit
Other Equipment by this Supplier
Other Equipment