STEM for Nanoscale Analysis – High Performance, High Resolution HT7710 from Hitachi

STEM for Nanoscale Analysis – High Performance, High Resolution HT7710 from Hitachi

With over 70 years of microscopy innovation, Hitachi offers the HT7710 STEM with maximum performance and productivity for in-situ analysis. The HT7710's radical design includes the user-friendliness and ergonomics of a SEM with the advanced resolution and analytical capabilities of a TEM/STEM.

It features completely digital imaging supported by a redesigned viewing chamber which accommodates Hitachi’s brightfield and darkfield STEM detectors.

Key Features

The key features of the HT7710 are:

  • STEM Performance for Soft/Hybrid Materials—40-120kV with a magnification range of 100-800,000X and image recording resolutions up to 5120 X 3840

  • High Magnification and Large FOV STEM—Ideal for high-resolution lattice imaging, bulk crystal structure, and nanoparticle analysis

  • Flexible Port Configurations—BF/DF STEM, EDS detectors, and cameras for high-throughput imaging and compositional data

  • Intuitive STEM GUI and Automation Features—All STEM images instantly archived in Hitachi’s EMIP database software

  • Optional High-Resolution Objective Lens– 1.4Å at low accelerating voltages with minimal beam damage

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