Site Sponsors
  • Strem Chemicals - Nanomaterials for R&D
  • Oxford Instruments Nanoanalysis - X-Max Large Area Analytical EDS SDD
  • Technical Sales Solutions - 5% off any SEM, TEM, FIB or Dual Beam
  • Park Systems - Manufacturer of a complete range of AFM solutions

Integrated AFM for Optical Microscopes - Nanosurf LensAFM

A powerful add-on to optical microscopes or 3D profilometers

The Nanosurf LensAFM is an atomic force microscope that can be used in place of a normal objective lens on almost any optical microscope or profilometer. It greatly extends the resolution and measuring capabilities of these instruments. The LensAFM not only provides 3D surface topography information, but can be used to analyze various physical properties of a measurement sample as well.

Main features and benefits of the LensAFM:

  • Mountable on virtually any optical microscope or 3D optical profilometer
  • Equipped with a quality objective lens for a clear view of your sample and the AFM cantilever
  • Simple sample positioning using the optical microscope’s view finder and position manipulators
  • Integrated motor for automated cantilever approach. Just bring your sample into optical focus and let the LensAFM do the rest.
  • Large AFM Z-range allows measurement of high structures
  • All standard AFM modes available through the modular easyScan 2 controller
  • Simply intuitive! Nanosurf’s ease of use makes for a very short learning curve.
Ask A Question

Do you have a question you'd like to ask the manufacturer of this equipment or can you provide feedback regarding your use of this equipment?

Leave your feedback
Submit
Other Equipment by this Supplier
Other Equipment